29 results
In situ Template Assisted Growth of Ag@Au Bimetallic Nanostructures
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- Microscopy and Microanalysis / Volume 25 / Issue S1 / February 2019
- Published online by Cambridge University Press:
- 07 February 2019, pp. 41-42
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- February 2019
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Color-banded gastropods from the Kendrick Shale Member (Middle Pennsylvanian, Westphalian B) of eastern Kentucky
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- Journal of Paleontology / Volume 64 / Issue 3 / May 1990
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- 14 July 2015, pp. 475-477
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Farmer Willingness to Supply Poultry Litter for Energy Conversion and to Invest in an Energy Conversion Cooperative
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- Journal of Agricultural and Applied Economics / Volume 42 / Issue 1 / February 2010
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- 26 January 2015, pp. 105-119
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Defects in Two Dimensional Crystals: An Ultra-high Resolution Aberration-corrected Electron Microscopy Study
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- Microscopy and Microanalysis / Volume 19 / Issue S2 / August 2013
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- 09 October 2013, pp. 618-619
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- August 2013
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Quantum Confinement in Germanium Quantum Dots Observed by Electron Energy-Loss Spectroscopy
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- Microscopy and Microanalysis / Volume 19 / Issue S2 / August 2013
- Published online by Cambridge University Press:
- 09 October 2013, pp. 1486-1487
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- August 2013
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Defects in Two Dimensional Crystals: An Ultra-high Resolution Aberration-corrected Electron Microscopy Study
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- Microscopy and Microanalysis / Volume 18 / Issue S2 / July 2012
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- 23 November 2012, pp. 1516-1517
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- July 2012
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Atomic-scale Interaction Dynamics in Few-layer Hexagonal Boron Nitride (h-BN)
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- Microscopy and Microanalysis / Volume 17 / Issue S2 / July 2011
- Published online by Cambridge University Press:
- 08 April 2017, pp. 1258-1259
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- July 2011
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Atomic Configuration of Planar Defects in Multiferroic Ca-doped BiFeO3 Films
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- Microscopy and Microanalysis / Volume 16 / Issue S2 / July 2010
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- 01 August 2010, pp. 96-97
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- July 2010
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Ultra-High-Resolution Transmission Electron Microscopy of Atomically Thin Hexagonal Boron Nitride (h-BN)
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- Microscopy and Microanalysis / Volume 16 / Issue S2 / July 2010
- Published online by Cambridge University Press:
- 01 August 2010, pp. 120-121
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- July 2010
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Atomic Resolution Mapping Using Quantitative High-angle Annular Dark Field Scanning Transmission Electron Microscopy
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- Microscopy and Microanalysis / Volume 15 / Issue S2 / July 2009
- Published online by Cambridge University Press:
- 26 July 2009, pp. 464-465
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- July 2009
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Atomic Resolution Imaging and Spectroscopy of Graphene Using the TEAM 0.5
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- Microscopy and Microanalysis / Volume 15 / Issue S2 / July 2009
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- 26 July 2009, pp. 124-125
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- July 2009
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Quantitative Li Mapping in Al alloys by Sub-eV Resolution Energy-Filtering Transmission Electron Microscopy (EFTEM) in the Aberration-Corrected, Monochromated TEAM0.5 Instrument
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- Microscopy and Microanalysis / Volume 15 / Issue S2 / July 2009
- Published online by Cambridge University Press:
- 26 July 2009, pp. 430-431
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- July 2009
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Detection of Single Atoms and Buried Defects in Three Dimensions by Aberration-Corrected Electron Microscope with 0.5-Å Information Limit
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- Microscopy and Microanalysis / Volume 14 / Issue 5 / October 2008
- Published online by Cambridge University Press:
- 16 September 2008, pp. 469-477
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- October 2008
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Object-defined Resolution Below 0.5Å in Transmission Electron Microscopy - Recent Advances on the TEAM 0.5 Instrument
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- Microscopy and Microanalysis / Volume 14 / Issue S2 / August 2008
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- 03 August 2008, pp. 78-79
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- August 2008
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Atomic Structure of Core-Shell Precipitates in Al-Li-Sc-Zr Alloys Studied by Analytical and Aberration-Corrected TEM/STEM
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- Microscopy and Microanalysis / Volume 14 / Issue S2 / August 2008
- Published online by Cambridge University Press:
- 03 August 2008, pp. 1348-1349
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- August 2008
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Aberration Corrected and Monochromated STEM/TEM for Materials Science
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- Microscopy and Microanalysis / Volume 13 / Issue S02 / August 2007
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- 05 August 2007, pp. 1180-1181
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- August 2007
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Retardation, Surface and Interface Effects in VEELS
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- Microscopy and Microanalysis / Volume 13 / Issue S02 / August 2007
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- 05 August 2007, pp. 1250-1251
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- August 2007
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Structural and ferromagnetic properties of Cu-doped GaN
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- Journal of Materials Research / Volume 22 / Issue 5 / May 2007
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- 18 July 2011, pp. 1396-1405
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- May 2007
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A New Era of Analysis with Spherical-Abervation Corrected STEM - Atomic and Electronic Information Approaching the Single Atom Level
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- Microscopy and Microanalysis / Volume 12 / Issue S02 / August 2006
- Published online by Cambridge University Press:
- 31 July 2006, pp. 1372-1373
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- August 2006
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Applications of Atomic Scale Scanning Transmission Electron Microscopy
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- Microscopy and Microanalysis / Volume 12 / Issue S02 / August 2006
- Published online by Cambridge University Press:
- 31 July 2006, pp. 134-135
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- August 2006
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