Hostname: page-component-8448b6f56d-t5pn6 Total loading time: 0 Render date: 2024-04-25T03:50:26.963Z Has data issue: false hasContentIssue false
  • English
  • Français

Defects in Two Dimensional Crystals: An Ultra-high Resolution Aberration-corrected Electron Microscopy Study

Published online by Cambridge University Press:  23 November 2012

N. Alem ,
S. Louie ,
A. Zettl ,
Q. Ramasse ,
O. Yazyev ,
C. Seabourne ,
A. Scott ,
C. Kisielowski ,
P. Hartel  and
B. Jiang
...Show all authors
N. Alem
Affiliation:
UC Berkeley, Berkeley, CA
S. Louie
Affiliation:
UC Berkeley, Berkeley, CA
A. Zettl
Affiliation:
UC Berkeley, Berkeley, CA
Q. Ramasse
Affiliation:
SuperSTEM Laboratory, Daresbury, United Kingdom
O. Yazyev
Affiliation:
Institute of Theoretical Physics, EPFL, Lausanne, Switzerland
C. Seabourne
Affiliation:
Institute for Materials Research, SPEME, University of Leeds, Leeds, United Kingdom
A. Scott
Affiliation:
Institute for Materials Research, SPEME, University of Leeds, Leeds, United Kingdom
C. Kisielowski
Affiliation:
National Center for Electron microscopy, Lawrence Berkeley National Laboratory, Berkeley, CA
P. Hartel
Affiliation:
CEOS, Heidelberg, Germany
B. Jiang
Affiliation:
FEI Company, Hillsboro, OR
R. Erni
Affiliation:
Empa, Duebendorf, Switzerland
Get access

Abstract

Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.

Type
Research Article
Information
Microscopy and Microanalysis , Volume 18 , Issue S2: Proceedings of Microscopy & Microanalysis 2012 , July 2012 , pp. 1516 - 1517
Copyright
Copyright © Microscopy Society of America 2012

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)