28 results
Hardware and Software Advances in Commercially Available Atom Probe Tomography Systems
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- Microscopy and Microanalysis / Volume 23 / Issue S1 / July 2017
- Published online by Cambridge University Press:
- 04 August 2017, pp. 40-41
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- July 2017
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Improving Data Quality in Atom Probe Tomography
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- Microscopy and Microanalysis / Volume 20 / Issue S3 / August 2014
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- 27 August 2014, pp. 2088-2089
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- August 2014
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Non-Tangential Continuity Reconstruction in Atom Probe Tomography Data
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- Microscopy and Microanalysis / Volume 17 / Issue S2 / July 2011
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- 08 April 2017, pp. 740-741
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- July 2011
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Phase Composition at the Atomic-Size Scale through Multivariate Statistical Analysis of Atom Probe Tomography Data
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- Microscopy and Microanalysis / Volume 17 / Issue S2 / July 2011
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- 08 April 2017, pp. 720-721
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- July 2011
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Complimentary Chemical Imaging of Au-Nanoparticles Embedded in MgO using Laser Assisted Atom Probe Tomography
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- Microscopy and Microanalysis / Volume 17 / Issue S2 / July 2011
- Published online by Cambridge University Press:
- 09 April 2017, pp. 738-739
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- July 2011
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Improved Yield and Data Quality in Atom Probe Tomography
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- Microscopy and Microanalysis / Volume 17 / Issue S2 / July 2011
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- 08 April 2017, pp. 714-715
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- July 2011
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Embedded Nanoparticle Analysis using Atom Probe Tomography and High-Resolution Electron Microscopy
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- Microscopy and Microanalysis / Volume 17 / Issue S2 / July 2011
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- 08 April 2017, pp. 760-761
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- July 2011
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Prospects for Atom Probe Tomography of Commercial Semiconductor Devices
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- Microscopy and Microanalysis / Volume 17 / Issue S2 / July 2011
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- 08 April 2017, pp. 752-753
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- July 2011
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Atomic-Scale Phase Composition through Multivariate Statistical Analysis of Atom Probe Tomography Data
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- Microscopy and Microanalysis / Volume 17 / Issue 3 / June 2011
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- 23 May 2011, pp. 418-430
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- June 2011
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Background Removal Methods Applied to Atom Probe Data
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- Microscopy and Microanalysis / Volume 15 / Issue S2 / July 2009
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- 26 July 2009, pp. 256-257
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- July 2009
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Pre-sharpened Microtips: An Efficient Sample Preparation Method for Atom Probe Tomography
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- Microscopy and Microanalysis / Volume 15 / Issue S2 / July 2009
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- 26 July 2009, pp. 296-297
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- July 2009
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Improvements in Three-Dimensional Compositional Analysis of Complex Alloys
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- Microscopy and Microanalysis / Volume 15 / Issue S2 / July 2009
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- 26 July 2009, pp. 294-295
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- July 2009
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Performance Improvements of Local Electrodes from In-situ Plasma Cleaning
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- Microscopy and Microanalysis / Volume 15 / Issue S2 / July 2009
- Published online by Cambridge University Press:
- 26 July 2009, pp. 286-287
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- July 2009
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Promoting Standards in Quantitative Atom Probe Tomography Analysis
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- Microscopy and Microanalysis / Volume 15 / Issue S2 / July 2009
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- 26 July 2009, pp. 260-261
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- July 2009
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Atom Probe Tomography Studies of GaN-Based Semiconductor Materials
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- Microscopy and Microanalysis / Volume 15 / Issue S2 / July 2009
- Published online by Cambridge University Press:
- 26 July 2009, pp. 280-281
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- July 2009
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Three Dimensional Compositional Characterization of Dielectric Films with LEAP Tomography
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- Microscopy and Microanalysis / Volume 13 / Issue S02 / August 2007
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- 05 August 2007, pp. 828-829
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- August 2007
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Compositional Imaging at the Atomic Scale with Atom Probe Tomography
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- Microscopy and Microanalysis / Volume 12 / Issue S02 / August 2006
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- 31 July 2006, pp. 1398-1399
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- August 2006
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Instrumentation Developments in Atom Probe Tomography: Applications in Semiconductor Research
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- Microscopy and Microanalysis / Volume 12 / Issue S02 / August 2006
- Published online by Cambridge University Press:
- 31 July 2006, pp. 1730-1731
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- August 2006
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Advantages of the Local Electrode for Atom Probe Tomography Applications.
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- Microscopy and Microanalysis / Volume 12 / Issue S02 / August 2006
- Published online by Cambridge University Press:
- 31 July 2006, pp. 1722-1723
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- August 2006
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Atomic Scale Compositional and Structural Characterization of Nanostructured Materials Using Combined FIB, STEM, and LEAP
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- Microscopy and Microanalysis / Volume 12 / Issue S02 / August 2006
- Published online by Cambridge University Press:
- 31 July 2006, pp. 1720-1721
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- August 2006
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