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Improving Data Quality in Atom Probe Tomography

Published online by Cambridge University Press:  27 August 2014

D.J. Larson
Affiliation:
CAMECA Instruments Inc., 5500 Nobel Drive, Madison, WI 53711 USA
T.J. Prosa
Affiliation:
CAMECA Instruments Inc., 5500 Nobel Drive, Madison, WI 53711 USA
D. Lawrence
Affiliation:
CAMECA Instruments Inc., 5500 Nobel Drive, Madison, WI 53711 USA
S.N. Strennen
Affiliation:
CAMECA Instruments Inc., 5500 Nobel Drive, Madison, WI 53711 USA
E. Oltman
Affiliation:
CAMECA Instruments Inc., 5500 Nobel Drive, Madison, WI 53711 USA
I. Martin
Affiliation:
CAMECA Instruments Inc., 5500 Nobel Drive, Madison, WI 53711 USA
D.A. Reinhard
Affiliation:
CAMECA Instruments Inc., 5500 Nobel Drive, Madison, WI 53711 USA
A. D. Giddings
Affiliation:
CAMECA Instruments Inc., 5500 Nobel Drive, Madison, WI 53711 USA
D. Olson
Affiliation:
CAMECA Instruments Inc., 5500 Nobel Drive, Madison, WI 53711 USA
J.H. Bunton
Affiliation:
CAMECA Instruments Inc., 5500 Nobel Drive, Madison, WI 53711 USA
R.M Ulfig
Affiliation:
CAMECA Instruments Inc., 5500 Nobel Drive, Madison, WI 53711 USA
T.F. Kelly
Affiliation:
CAMECA Instruments Inc., 5500 Nobel Drive, Madison, WI 53711 USA
J. R. Goodwin
Affiliation:
Metallurgical and Materials Engineering, University of Alabama, Tuscaloosa, AL, 35487 USA
R.L. Martens
Affiliation:
Metallurgical and Materials Engineering, University of Alabama, Tuscaloosa, AL, 35487 USA
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Abstract

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Copyright
Copyright © Microscopy Society of America 2014 

References

1. Brandon, D. G. in, Field Ion Microscopy, eds. J. Hren, S. Ranganathan (Plenum (1968) p.64.
2. Müller, E. W., Tsong, T. T. Prog. Surf. Sci. 4 (1973) p.1.
3. Wilkes, T. J., et al., J. Phys. D: Appl Phys. 5 (1972) p.2226.
4. Zătsev, S. V. Tech. Phys. Lett. 30 (3) (2004) p.190.
5. Mikhailovskij, I. M., et al., Ultramicroscopy 109 (209) p.480.
6. Kölling, S., Vandervorst, W. Ultramicroscopy 109 (2009) p.486.
7. Larson, D. J., et al., Microsc. Microanal. 19(S2 (2013) p.994.
8. Bunton, J. H., et al., Microsc. Microanal. 13 (2007) p.418.
9. Gault, B., et al., Ultramicroscopy 110 (2010). p.1215.
10. Kellogg, G. L. J. Appl. Phys. 53(9 (1982) p.6383.
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