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Improving Data Quality in Atom Probe Tomography

Published online by Cambridge University Press:  27 August 2014

D.J. Larson ,
T.J. Prosa ,
D. Lawrence ,
S.N. Strennen ,
E. Oltman ,
I. Martin ,
D.A. Reinhard ,
A. D. Giddings ,
D. Olson  and
J.H. Bunton
...Show all authors
D.J. Larson
Affiliation:
CAMECA Instruments Inc., 5500 Nobel Drive, Madison, WI 53711 USA
T.J. Prosa
Affiliation:
CAMECA Instruments Inc., 5500 Nobel Drive, Madison, WI 53711 USA
D. Lawrence
Affiliation:
CAMECA Instruments Inc., 5500 Nobel Drive, Madison, WI 53711 USA
S.N. Strennen
Affiliation:
CAMECA Instruments Inc., 5500 Nobel Drive, Madison, WI 53711 USA
E. Oltman
Affiliation:
CAMECA Instruments Inc., 5500 Nobel Drive, Madison, WI 53711 USA
I. Martin
Affiliation:
CAMECA Instruments Inc., 5500 Nobel Drive, Madison, WI 53711 USA
D.A. Reinhard
Affiliation:
CAMECA Instruments Inc., 5500 Nobel Drive, Madison, WI 53711 USA
A. D. Giddings
Affiliation:
CAMECA Instruments Inc., 5500 Nobel Drive, Madison, WI 53711 USA
D. Olson
Affiliation:
CAMECA Instruments Inc., 5500 Nobel Drive, Madison, WI 53711 USA
J.H. Bunton
Affiliation:
CAMECA Instruments Inc., 5500 Nobel Drive, Madison, WI 53711 USA
R.M Ulfig
Affiliation:
CAMECA Instruments Inc., 5500 Nobel Drive, Madison, WI 53711 USA
T.F. Kelly
Affiliation:
CAMECA Instruments Inc., 5500 Nobel Drive, Madison, WI 53711 USA
J. R. Goodwin
Affiliation:
Metallurgical and Materials Engineering, University of Alabama, Tuscaloosa, AL, 35487 USA
R.L. Martens
Affiliation:
Metallurgical and Materials Engineering, University of Alabama, Tuscaloosa, AL, 35487 USA

Abstract

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Abstract
Information
Microscopy and Microanalysis , Volume 20 , Supplement S3: Proceedings of Microscopy & Microanalysis 2014 , August 2014 , pp. 2088 - 2089
Copyright
Copyright © Microscopy Society of America 2014 

References

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