59 results
NanoMi: An Open Source Electron Microscope Component Integration
-
- Journal:
- Microscopy and Microanalysis / Volume 28 / Issue S1 / August 2022
- Published online by Cambridge University Press:
- 22 July 2022, pp. 3164-3165
- Print publication:
- August 2022
-
- Article
-
- You have access
- Export citation
In-situ Calibration for Angle-resolved Valence EELS
-
- Journal:
- Microscopy and Microanalysis / Volume 28 / Issue S1 / August 2022
- Published online by Cambridge University Press:
- 22 July 2022, pp. 2032-2034
- Print publication:
- August 2022
-
- Article
-
- You have access
- Export citation
In-Situ Mass Thickness Calibrations Using MWCNTs
-
- Journal:
- Microscopy and Microanalysis / Volume 25 / Issue S2 / August 2019
- Published online by Cambridge University Press:
- 05 August 2019, pp. 792-793
- Print publication:
- August 2019
-
- Article
-
- You have access
- Export citation
The Effect of Noise in Images on Electron Tomography Reconstruction
-
- Journal:
- Microscopy and Microanalysis / Volume 19 / Issue S2 / August 2013
- Published online by Cambridge University Press:
- 09 October 2013, pp. 570-571
- Print publication:
- August 2013
-
- Article
-
- You have access
- Export citation
Centralized Instrument Control for a TEM Laboratory
-
- Journal:
- Microscopy and Microanalysis / Volume 19 / Issue S2 / August 2013
- Published online by Cambridge University Press:
- 09 October 2013, pp. 1394-1395
- Print publication:
- August 2013
-
- Article
-
- You have access
- Export citation
Evaluating long-term stability and transient disturbances of a TEM
-
- Journal:
- Microscopy and Microanalysis / Volume 19 / Issue S2 / August 2013
- Published online by Cambridge University Press:
- 09 October 2013, pp. 1202-1203
- Print publication:
- August 2013
-
- Article
-
- You have access
- Export citation
The sources of contamination of TEM samples and the means for its reduction
-
- Journal:
- Microscopy and Microanalysis / Volume 18 / Issue S2 / July 2012
- Published online by Cambridge University Press:
- 23 November 2012, pp. 1480-1481
- Print publication:
- July 2012
-
- Article
- Export citation
Two-step Deconvolution in Electron Energy-loss Spectroscopy on hBN K-edge
-
- Journal:
- Microscopy and Microanalysis / Volume 18 / Issue S2 / July 2012
- Published online by Cambridge University Press:
- 23 November 2012, pp. 1034-1035
- Print publication:
- July 2012
-
- Article
- Export citation
Electron Tomography Applied to an Indium Tin Oxide Nanowhisker
-
- Journal:
- Microscopy and Microanalysis / Volume 18 / Issue S2 / July 2012
- Published online by Cambridge University Press:
- 23 November 2012, pp. 568-569
- Print publication:
- July 2012
-
- Article
- Export citation
Practical hole-free phase plate imaging: principles, advantages and pitfalls
-
- Journal:
- Microscopy and Microanalysis / Volume 18 / Issue S2 / July 2012
- Published online by Cambridge University Press:
- 23 November 2012, pp. 484-485
- Print publication:
- July 2012
-
- Article
- Export citation
A New Method to Fabricate 3D Electron Tomography Sample Using FIB Technique
-
- Journal:
- Microscopy and Microanalysis / Volume 17 / Issue S2 / July 2011
- Published online by Cambridge University Press:
- 08 April 2017, pp. 690-691
- Print publication:
- July 2011
-
- Article
-
- You have access
- Export citation
Development of Environmental Specimen Holder for Hitachi S-5500 UHR SEM Microscope
-
- Journal:
- Microscopy and Microanalysis / Volume 17 / Issue S2 / July 2011
- Published online by Cambridge University Press:
- 08 April 2017, pp. 434-435
- Print publication:
- July 2011
-
- Article
-
- You have access
- Export citation
EELS Investigation of the Formulas for Inelastic Mean Free Path
-
- Journal:
- Microscopy and Microanalysis / Volume 17 / Issue S2 / July 2011
- Published online by Cambridge University Press:
- 09 April 2017, pp. 1466-1467
- Print publication:
- July 2011
-
- Article
-
- You have access
- Export citation
Technique for Complex Averaging of Electron Holograms
-
- Journal:
- Microscopy and Microanalysis / Volume 17 / Issue S2 / July 2011
- Published online by Cambridge University Press:
- 08 April 2017, pp. 918-919
- Print publication:
- July 2011
-
- Article
-
- You have access
- Export citation
UV Treatment of TEM/STEM Samples for Reduced Hydrocarbon Contamination
-
- Journal:
- Microscopy and Microanalysis / Volume 17 / Issue S2 / July 2011
- Published online by Cambridge University Press:
- 09 April 2017, pp. 1026-1027
- Print publication:
- July 2011
-
- Article
-
- You have access
- Export citation
TEM Analysis of Soy Protein Based Nanoparticles as Nutraceutical Carriers
-
- Journal:
- Microscopy and Microanalysis / Volume 17 / Issue S2 / July 2011
- Published online by Cambridge University Press:
- 08 April 2017, pp. 1150-1151
- Print publication:
- July 2011
-
- Article
-
- You have access
- Export citation
Phase Plate Enhanced Contrast Reveals Structure of Follicular Melanin Granules
-
- Journal:
- Microscopy and Microanalysis / Volume 17 / Issue S2 / July 2011
- Published online by Cambridge University Press:
- 08 April 2017, pp. 984-985
- Print publication:
- July 2011
-
- Article
-
- You have access
- Export citation
Determination of Camera Modulation-Transfer Function by Electron Holography
-
- Journal:
- Microscopy and Microanalysis / Volume 16 / Issue S2 / July 2010
- Published online by Cambridge University Press:
- 01 August 2010, pp. 140-141
- Print publication:
- July 2010
-
- Article
-
- You have access
- Export citation
Convenient Contrast Enhancement by Hole-Free Phase Plate in a TEM
-
- Journal:
- Microscopy and Microanalysis / Volume 16 / Issue S2 / July 2010
- Published online by Cambridge University Press:
- 01 August 2010, pp. 526-527
- Print publication:
- July 2010
-
- Article
-
- You have access
- Export citation
Local Thickness Measurement in TEM
-
- Journal:
- Microscopy and Microanalysis / Volume 16 / Issue S2 / July 2010
- Published online by Cambridge University Press:
- 01 August 2010, pp. 344-345
- Print publication:
- July 2010
-
- Article
-
- You have access
- Export citation