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In-situ Calibration for Angle-resolved Valence EELS
Published online by Cambridge University Press: 22 July 2022
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- Type
- On Demand - Nanoscale Optics with Electrons and Photons
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- Copyright
- Copyright © Microscopy Society of America 2022
References
Kahl, F. et al. , Adv. Imaging and Electron Physics 212, (2019), p.35.10.1016/bs.aiep.2019.08.005CrossRefGoogle Scholar
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We grateful for ongoing outstanding support of Hitachi High Tech Canada.Google Scholar