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In-situ Calibration for Angle-resolved Valence EELS

Published online by Cambridge University Press:  22 July 2022

M. Malac ,
M. Hayashida ,
H. Müller ,
Y. Taniguchi  and
R.F. Egerton
M. Malac
Affiliation:
NRC-NANO, Edmonton, Canada Department of Physics, University of Alberta, Edmonton, Canada
M. Hayashida
Affiliation:
NRC-NANO, Edmonton, Canada
H. Müller
Affiliation:
CEOS GmbH, Englerstr. 28, D-69126 Heidelberg, Germany
Y. Taniguchi
Affiliation:
Hitachi High-Tech Corp., Hitachinaka-shi, 882 Ichige, Ibaraki-ken, Japan
R.F. Egerton
Affiliation:
Department of Physics, University of Alberta, Edmonton, Canada

Abstract

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Type
On Demand - Nanoscale Optics with Electrons and Photons
Information
Microscopy and Microanalysis , Volume 28 , Supplement S1 , August 2022 , pp. 2032 - 2034
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Copyright
Copyright © Microscopy Society of America 2022

References

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We grateful for ongoing outstanding support of Hitachi High Tech Canada.Google Scholar