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Local Thickness Measurement in TEM

Published online by Cambridge University Press:  01 August 2010

H Zhang ,
RF Egerton  and
M Malac
H Zhang
Affiliation:
National Institute for Nanotechnology, Canada
RF Egerton
Affiliation:
University of Alberta, Canada
M Malac
Affiliation:
National Institute for Nanotechnology, Canada

Extract

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Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

Type
Abstract
Information
Microscopy and Microanalysis , Volume 16 , Supplement S2 , July 2010 , pp. 344 - 345
Copyright
Copyright © Microscopy Society of America 2010