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45 results

Page 1 of 3

  • Low-Z FIB Grids for Reducing Spurious Fluorescence and X-ray Overlaps
  • Lucille A. Giannuzzi, Nicolaie Moldovan, Jamie A. Trindell, Joshua D. Sugar
  • Journal: Microscopy Today / Volume 30 / Issue 2 / March 2022
  • Published online by Cambridge University Press: 25 March 2022, pp. 24-29
  • Print publication: March 2022
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    Low-Z nanocrystalline diamond (NCD) grids have been developed to reduce spurious fluorescence and avoid X-ray peak overlaps or interferences between the specimen and conventional metal grids. The low-Z NCD grids are non-toxic and safe to handle, conductive, can be subjected to high-temperature heating experiments, and may be used for analytical work in lieu of metal grids. Both a half-grid geometry, which can be used for any lift-out method, or a full-grid geometry that can be used for ex situ lift-out or thin film analyses, can be fabricated and used for experiments.

  • Mechanism of FIB-Induced Phase Transformation in Austenitic Steel
  • Joseph R. Michael, Lucille A. Giannuzzi, M. Grace Burke, Xiang Li Zhong
  • Journal: Microscopy and Microanalysis / Volume 28 / Issue 1 / February 2022
  • Published online by Cambridge University Press: 29 November 2021, pp. 70-82
  • Print publication: February 2022
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    The transformation of unstable austenite to ferrite or α′ martensite as a result of exposure to Xe+ or Ga+ ions at room temperature was studied in a 304 stainless steel casting alloy. Controlled Xe+ and Ga+ ion beam exposures of the 304 were carried out at a variety of beam/sample geometries. It was found that both Ga+ and Xe+ ion irradiation resulted in the transformation of the austenite to either ferrite or α′ martensite. In this paper, we will refer to the transformation product as a BCC phase. The crystallographic orientation of the transformed area was controlled by the orientation of the austenite grain and was consistent with either the Nishiyama–Wasserman or the Kurdjumov–Sachs orientation relationships. On the basis of the Xe+ and Ga+ ion beam exposures, the transformation is not controlled by the chemical stabilization of the BCC phase by the ion species, but is a result of the disorder caused by the ion-induced recoil motion and subsequent return of the disordered region to a more energetically favorable phase.

  • Ion-induced Transformation of Metastable Phases
  • Lucille Giannuzzi, Joseph Michael
  • Journal: Microscopy and Microanalysis / Volume 26 / Issue S2 / August 2020
  • Published online by Cambridge University Press: 30 July 2020, pp. 792-793
  • Print publication: August 2020
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  • FIB Sample Preparation for In Depth EDS Analysis
  • Roberto Garcia, Fred A. Stevie, Lucille Giannuzzi
  • Journal: Microscopy and Microanalysis / Volume 25 / Issue S2 / August 2019
  • Published online by Cambridge University Press: 05 August 2019, pp. 914-915
  • Print publication: August 2019
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  • Optimizing Van der Waals Forces For FIB ex situ Lift Out
  • Lucille A. Giannuzzi, Trevor Clark
  • Journal: Microscopy and Microanalysis / Volume 23 / Issue S1 / July 2017
  • Published online by Cambridge University Press: 04 August 2017, pp. 306-307
  • Print publication: July 2017
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  • Site-Specific Manipulation of CNTs to EXpressLO™ Grids for TEM Analysis
  • Paul A. Anzalone, Lucille A. Giannuzzi
  • Journal: Microscopy and Microanalysis / Volume 22 / Issue S3 / July 2016
  • Published online by Cambridge University Press: 25 July 2016, pp. 1744-1745
  • Print publication: July 2016
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  • Vacuum Assisted ex situ Lift Out of FIB Prepared Specimens
  • Lucille A. Giannuzzi, Dustin Hess, Trevor Clark
  • Journal: Microscopy and Microanalysis / Volume 21 / Issue S3 / August 2015
  • Published online by Cambridge University Press: 23 September 2015, pp. 1407-1408
  • Print publication: August 2015
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  • Theory and New Applications of Ex Situ Lift Out
  • Lucille A. Giannuzzi, Zhiyang Yu, Denise Yin, Martin P. Harmer, Qiang Xu, Noel S. Smith, Lisa Chan, Jon Hiller, Dustin Hess, Trevor Clark
  • Journal: Microscopy and Microanalysis / Volume 21 / Issue 4 / August 2015
  • Published online by Cambridge University Press: 16 July 2015, pp. 1034-1048
  • Print publication: August 2015
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    The ex situ lift out (EXLO) adhesion forces are reviewed and new applications of EXLO for focused ion beam (FIB)-prepared specimens are described. EXLO is used to manipulate electron transparent specimens on microelectromechanical systems carrier devices designed for in situ electron microscope analysis. A new patented grid design without a support film is described for EXLO. This new slotted grid design provides a surface for holding the specimen in place and also allows for post lift out processing. Specimens may be easily manipulated into a backside orientation to reduce FIB curtaining artifacts with this slotted grid. Large EXLO specimens can be manipulated from Xe+ plasma FIB prepared specimens. Finally, applications of EXLO and manipulation of FIB specimens using a vacuum probe lift out method are shown. The vacuum probe provides more control for placing specimens on the new slotted grids and also allows for easy manipulation into a backside configuration.

  • Discussion of Electron Induced Atomic Number Contrast
  • Lucille A. Giannuzzi
  • Journal: Microscopy and Microanalysis / Volume 20 / Issue S3 / August 2014
  • Published online by Cambridge University Press: 27 August 2014, pp. 22-23
  • Print publication: August 2014
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  • Ex situ Lift Out of PFIB Prepared TEM Specimens
  • Lucille A. Giannuzzi, Noel S. Smith
  • Journal: Microscopy and Microanalysis / Volume 20 / Issue S3 / August 2014
  • Published online by Cambridge University Press: 27 August 2014, pp. 340-341
  • Print publication: August 2014
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