Hostname: page-component-76fb5796d-vfjqv Total loading time: 0 Render date: 2024-04-26T14:00:10.983Z Has data issue: false hasContentIssue false
  • English
  • Français

Optimizing Van der Waals Forces For FIB ex situ Lift Out

Published online by Cambridge University Press:  04 August 2017

Lucille A. Giannuzzi  and
Trevor Clark
Lucille A. Giannuzzi
Affiliation:
EXpressLO LLC, Lehigh Acres, FL 33971USA.
Trevor Clark
Affiliation:
The Pennsylvania State University, University Park, PA 16802USA.

Abstract

An abstract is not available for this content so a preview has been provided. As you have access to this content, a full PDF is available via the ‘Save PDF’ action button.
Image of the first page of this content. For PDF version, please use the ‘Save PDF’ preceeding this image.'
Type
Abstract
Information
Microscopy and Microanalysis , Volume 23 , Supplement S1: Proceedings of Microscopy & Microanalysis 2017 , July 2017 , pp. 306 - 307
Copyright
© Microscopy Society of America 2017 

References

[1] Giannuzzi, L.A., et al, Microsc. Microanal. 21 2015). p. 1032.Google Scholar
[2] Tracy, B., et al, Microsc. Microanal. 15(2 2009). p. 314.Google Scholar
[3] https://en.wikipedia.org/wiki/Permanent_marker.Google Scholar
[4] FIB work was performed on a FIB 200 in collaboration with TSS Microscopy.Google Scholar