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85 results

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  • Ronchigram Simulation and Aberration Correction Training Using Ronchigram.com

  • Suk Hyun Sung, Noah Schnitzer, William Millsaps, Lena F. Kourkoutis, Robert Hovden
  • Journal:
    Microscopy Today / Volume 30 / Issue 5 / September 2022
    Published online by Cambridge University Press:
    22 September 2022, pp. 40-43
    Print publication:
    September 2022
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  • This article introduces a training simulator for electron beam alignment using Ronchigrams. The interactive web application, www.ronchigram.com, is an advanced educational tool aimed at making scanning transmission electron microscopy (STEM) more accessible and open. For experienced microscopists, the tool offers on-hand quantification of simulated Ronchigrams and their resolution limits.

  • Disentangling Coexisting Structural Order Through Phase Lock-In Analysis of Atomic-Resolution STEM Data

  • Berit H. Goodge, Ismail El Baggari, Seung Sae Hong, Zhe Wang, Darrell G. Schlom, Harold Y. Hwang, Lena F. Kourkoutis
  • Journal:
    Microscopy and Microanalysis / Volume 28 / Issue 2 / April 2022
    Published online by Cambridge University Press:
    22 February 2022, pp. 404-411
    Print publication:
    April 2022

  • As a real-space technique, atomic-resolution STEM imaging contains both amplitude and geometric phase information about structural order in materials, with the latter encoding important information about local variations and heterogeneities present in crystalline lattices. Such phase information can be extracted using geometric phase analysis (GPA), a method which has generally focused on spatially mapping elastic strain. Here we demonstrate an alternative phase demodulation technique and its application to reveal complex structural phenomena in correlated quantum materials. As with other methods of image phase analysis, the phase lock-in approach can be implemented to extract detailed information about structural order and disorder, including dislocations and compound defects in crystals. Extending the application of this phase analysis to Fourier components that encode periodic modulations of the crystalline lattice, such as superlattice or secondary frequency peaks, we extract the behavior of multiple distinct order parameters within the same image, yielding insights into not only the crystalline heterogeneity but also subtle emergent order parameters such as antipolar displacements. When applied to atomic-resolution images spanning large (~0.5 × 0.5 μm2) fields of view, this approach enables vivid visualizations of the spatial interplay between various structural orders in novel materials.

  • Atomic-resolution STEM-EELS to probe and stabilize superconductivity in thin films

  • Berit Goodge, Lena Kourkoutis
  • Journal:
    Microscopy and Microanalysis / Volume 27 / Issue S1 / August 2021
    Published online by Cambridge University Press:
    30 July 2021, pp. 346-347
    Print publication:
    August 2021
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Page 1 of 5