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Combining STEM Imaging and X-Ray Diffraction for Structure Determination of a New Highly Distorted Infinite-Layer Phase

Published online by Cambridge University Press:  22 July 2022

Michelle A. Smeaton ,
Woo Jin Kim ,
Berit H. Goodge ,
Kyuho Lee ,
Motoki Osada ,
Harold Y. Hwang  and
Lena F. Kourkoutis
Michelle A. Smeaton
Affiliation:
Department of Materials Science & Engineering, Cornell University, Ithaca, NY, United States
Woo Jin Kim
Affiliation:
Stanford Institute for Materials and Energy Sciences, SLAC National Accelerator Laboratory, Menlo Park, CA, United States Department of Applied Physics, Stanford University, Stanford, CA, United States
Berit H. Goodge
Affiliation:
School of Applied & Engineering Physics, Cornell University, Ithaca, NY, United States
Kyuho Lee
Affiliation:
Stanford Institute for Materials and Energy Sciences, SLAC National Accelerator Laboratory, Menlo Park, CA, United States Department of Physics, Stanford University, Stanford, CA, United States
Motoki Osada
Affiliation:
Stanford Institute for Materials and Energy Sciences, SLAC National Accelerator Laboratory, Menlo Park, CA, United States Department of Materials Science & Engineering, Stanford University, Stanford, CA, United States
Harold Y. Hwang
Affiliation:
Stanford Institute for Materials and Energy Sciences, SLAC National Accelerator Laboratory, Menlo Park, CA, United States Department of Applied Physics, Stanford University, Stanford, CA, United States
Lena F. Kourkoutis*
Affiliation:
School of Applied & Engineering Physics, Cornell University, Ithaca, NY, United States Kavli Institute for Nanoscale Science, Cornell University, Ithaca, NY, United States
*
*Corresponding author: lena.f.kourkoutis@cornell.edu

Abstract

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Type
Advanced Imaging and Spectroscopy for Nanoscale Materials
Information
Microscopy and Microanalysis , Volume 28 , Supplement S1 , August 2022 , pp. 2582 - 2584
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Copyright
Copyright © Microscopy Society of America 2022

References

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This work was supported by DOD AFOSR (FA 9550-16-1-0305) and NSF (DMR-1719875, DGE-1650441).Google Scholar