Hostname: page-component-7c8c6479df-5xszh Total loading time: 0 Render date: 2024-03-28T17:38:58.987Z Has data issue: false hasContentIssue false

Signal Enhancement of Low-Dose Cryogenic 4D-STEM Data for Mapping of Beam Sensitive Materials

Published online by Cambridge University Press:  22 July 2022

Danielle Markovich
Affiliation:
School of Applied and Engineering Physics, Cornell University, Ithaca NY, 14853, USA
Michael Colletta
Affiliation:
School of Applied and Engineering Physics, Cornell University, Ithaca NY, 14853, USA
Yue Yu
Affiliation:
School of Applied and Engineering Physics, Cornell University, Ithaca NY, 14853, USA
Megan Treichel
Affiliation:
Department of Chemistry, Carnegie Mellon University, Pittsburgh, Pennsylvania 15213, USA
Kevin J. T. Noonan
Affiliation:
Department of Chemistry, Carnegie Mellon University, Pittsburgh, Pennsylvania 15213, USA
Lena F. Kourkoutis
Affiliation:
School of Applied and Engineering Physics, Cornell University, Ithaca NY, 14853, USA Kavli Institute at Cornell, Cornell University, Ithaca, NY 14853, USA

Abstract

Image of the first page of this content. For PDF version, please use the ‘Save PDF’ preceeding this image.'
Type
Developments of 4D-STEM Imaging - Enabling New Materials Applications
Copyright
Copyright © Microscopy Society of America 2022

References

Panova, O., et al. Nature Materials 18, 860-865 (2019).CrossRefGoogle Scholar
Markovich, D., et al. Microscopy and Microanalysis 27, 12-13 (2021).CrossRefGoogle Scholar
Treichel, M., et al. Macromolecules 53, 8509-8518 (2020).CrossRefGoogle Scholar
Phillipp, H. T., et al. arXiv:2111.05889 (2021).Google Scholar
Goodge, B., et al. Microscopy and Microanalysis, 26(3), 439-446. (2020).CrossRefGoogle Scholar
Egerton, R. F.. Micron 119, 72-87 (2019).CrossRefGoogle Scholar