13 results
Opportunities and Challenges of Ultra Short Pulsed Lasers with Dual Focused Ion Beams for Characterization of Full-Scale Electronic Devices
- Journal: Microscopy and Microanalysis / Volume 28 / Issue S1 / August 2022
- Published online by Cambridge University Press: 22 July 2022, pp. 884-886
- Print publication: August 2022
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Correlative Electron Energy-Loss Spectroscopy Bandgap Mapping and DFT Modeling in AlGaN Diodes
- Journal: Microscopy and Microanalysis / Volume 28 / Issue S1 / August 2022
- Published online by Cambridge University Press: 22 July 2022, pp. 2010-2011
- Print publication: August 2022
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Focused Ion Beam Characterization of Low Melting Point Metals at Cryogenic Temperatures
- Journal: Microscopy and Microanalysis / Volume 28 / Issue S1 / August 2022
- Published online by Cambridge University Press: 22 July 2022, pp. 78-79
- Print publication: August 2022
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Identification of Star Defects in Gallium Nitride with HREBSD and ECCI
- Journal: Microscopy and Microanalysis / Volume 27 / Issue 2 / April 2021
- Published online by Cambridge University Press: 16 April 2021, pp. 257-265
- Print publication: April 2021
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Quantitative Characterization of Misfit Dislocations at GaP/Si Heteroepitaxial Interfaces via Electron Channeling Contrast Imaging and Semi-Automated Image Analysis
- Journal: Microscopy and Microanalysis / Volume 25 / Issue S2 / August 2019
- Published online by Cambridge University Press: 05 August 2019, pp. 202-203
- Print publication: August 2019
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Characterization of Sub-Bandgap Plasmon Excitations in Transparent Conducting Oxides with Electron Energy-Loss Spectroscopy
- Journal: Microscopy and Microanalysis / Volume 25 / Issue S2 / August 2019
- Published online by Cambridge University Press: 05 August 2019, pp. 600-601
- Print publication: August 2019
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Characterization of Sub-Bandgap Energy States in CuInxGa(i-x)Se2 and Transparent Conducting Oxides with Electron Energy-Loss Spectroscopy
- Journal: Microscopy and Microanalysis / Volume 24 / Issue S1 / August 2018
- Published online by Cambridge University Press: 01 August 2018, pp. 456-457
- Print publication: August 2018
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Nano-Cathodoluminescence Measurement of Asymmetric Carrier Trapping and Radiative Recombination in GaN and InGaN Quantum Disks
- Journal: Microscopy and Microanalysis / Volume 24 / Issue 2 / April 2018
- Published online by Cambridge University Press: 27 April 2018, pp. 93-98
- Print publication: April 2018
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Detecting Sub Bandgap Energies in CIGS with Electron Energy-Loss Spectroscopy
- Journal: Microscopy and Microanalysis / Volume 23 / Issue S1 / July 2017
- Published online by Cambridge University Press: 04 August 2017, pp. 1546-1547
- Print publication: July 2017
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Advancement of Heteroepitaxial III-V/Si Thin Films through Defect Characterization
- Journal: Microscopy and Microanalysis / Volume 22 / Issue S3 / July 2016
- Published online by Cambridge University Press: 25 July 2016, pp. 1538-1539
- Print publication: July 2016
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Accessing High Spatial Resolution Low-Loss EELS Information without Cerenkov Radiation
- Journal: Microscopy and Microanalysis / Volume 22 / Issue S3 / July 2016
- Published online by Cambridge University Press: 25 July 2016, pp. 976-977
- Print publication: July 2016
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Site-Specific TEM Specimen Preparation of Samples with Sub-Surface Features
- Journal: Microscopy and Microanalysis / Volume 21 / Issue S3 / August 2015
- Published online by Cambridge University Press: 23 September 2015, pp. 2157-2158
- Print publication: August 2015
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Novel Applications of Electron Channeling Contrast Imaging
- Journal: Microscopy and Microanalysis / Volume 21 / Issue S3 / August 2015
- Published online by Cambridge University Press: 23 September 2015, pp. 1897-1898
- Print publication: August 2015
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