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Accessing High Spatial Resolution Low-Loss EELS Information without Cerenkov Radiation

Published online by Cambridge University Press:  25 July 2016

Julia I. Deitz
Affiliation:
Dept. of Materials Science & Engineering, The Ohio State University, Columbus, OH, 43210, USA
Tyler J. Grassman
Affiliation:
Dept. of Materials Science & Engineering, The Ohio State University, Columbus, OH, 43210, USA Dept. of Electrical & Computer Engineering, The Ohio State University, Columbus, OH, 43210, USA
David W. McComb
Affiliation:
Dept. of Materials Science & Engineering, The Ohio State University, Columbus, OH, 43210, USA

Abstract

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Type
Abstract
Copyright
© Microscopy Society of America 2016 

References

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