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Opportunities and Challenges of Ultra Short Pulsed Lasers with Dual Focused Ion Beams for Characterization of Full-Scale Electronic Devices

Published online by Cambridge University Press:  22 July 2022

Julia I. Deitz*
Affiliation:
Sandia National Laboratories, PO Box 5800, MS 0886, Albuquerque, NM 87185-0886
Daniel L. Perry
Affiliation:
Sandia National Laboratories, PO Box 5800, MS 0886, Albuquerque, NM 87185-0886
Andrew T. Polonsky
Affiliation:
Sandia National Laboratories, PO Box 5800, MS 0886, Albuquerque, NM 87185-0886
Timothy J. Ruggles
Affiliation:
Sandia National Laboratories, PO Box 5800, MS 0886, Albuquerque, NM 87185-0886
Katherine L. Jungjohann
Affiliation:
National Renewable Energy Laboratory, Golden, CO 80401
Katharine L. Harrison
Affiliation:
Sandia National Laboratories, PO Box 5800, MS 0886, Albuquerque, NM 87185-0886
Josefine D. McBrayer
Affiliation:
Sandia National Laboratories, PO Box 5800, MS 0886, Albuquerque, NM 87185-0886
Joseph R. Michael
Affiliation:
Sandia National Laboratories, PO Box 5800, MS 0886, Albuquerque, NM 87185-0886
*
*Corresponding author: jdeitz@sandia.gov

Abstract

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Type
Ultrashort Pulse Lasers: Microscopy, Simulations, and Material Interactions
Copyright
Copyright © Microscopy Society of America 2022

References

Echlin, McLean P. et al. , (2020) COSSMS 24(2) 100817.Google Scholar
Jungjohann, Katherine L. et al. , (2021) ACS Energy Lett. 6 21382144.CrossRefGoogle Scholar
Harrison, Katharine L. et al. , (2021) Iscience 24(12) 103394.CrossRefGoogle Scholar