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Advancement of Heteroepitaxial III-V/Si Thin Films through Defect Characterization

Published online by Cambridge University Press:  25 July 2016

Julia I. Deitz ,
David W. McComb  and
Tyler J. Grassman
Julia I. Deitz
Affiliation:
Dept. of Materials Science & Engineering, The Ohio State University, Columbus, OH, 43210, USA
David W. McComb
Affiliation:
Dept. of Materials Science & Engineering, The Ohio State University, Columbus, OH, 43210, USA
Tyler J. Grassman
Affiliation:
Dept. of Materials Science & Engineering, The Ohio State University, Columbus, OH, 43210, USA Dept. of Electrical & Computer Engineering, The Ohio State University, Columbus, OH, 43210, USA

Abstract

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Information
Microscopy and Microanalysis , Volume 22 , Supplement S3: Proceedings of Microscopy & Microanalysis 2016 , July 2016 , pp. 1538 - 1539
Copyright
© Microscopy Society of America 2016 

References

[1] Grassman, T. J., Brenner, M. R., Rajagopalan, S., Unocic, R., Dehoff, R., Mills, M. J., Fraser, H. & Ringel, S. A. Appl. Phys. Lett 94, 232106 (2009).CrossRefGoogle Scholar
[2] Grassman, T. J., Carlin, J. A., Galiana, B., Yang, L. M., Yang, F., Mills, M. J. & Ringel, S. A. Appl. Phys. Lett 102, 142102 (2013).CrossRefGoogle Scholar
[3] Deitz, J. I., Carnevale, S., Ringel, S. A., McComb, D. W. & Grassman, T. J. J. Vis. Exp (52745R2 2015.Google Scholar
[4] Carnevale, S. D., Deitz, J. I., Grassman, T. J., Carlin, J. A., Picard, Y., De Graef, M. & Ringel, S. Appl. Phys. Lett 104(23), 232111 (2014).CrossRefGoogle Scholar
[5] Carnevale, S. D., Deitz, J. I., Grassman, T. J., Carlin, J. A., Picard, Y., De Graef, M. & Ringel, S. A. IEEE J. PV 5(2), 676 (2015).Google Scholar