28 results
Contributors
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- Book:
- The Cambridge Handbook of Psycholinguistics
- Published online:
- 05 November 2012
- Print publication:
- 20 August 2012, pp xi-xiv
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Materials Characterization using THz Ellipsometry
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- Journal:
- MRS Online Proceedings Library Archive / Volume 1163 / 2009
- Published online by Cambridge University Press:
- 31 January 2011, 1163-K08-04
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- 2009
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Monitoring Organic Thin Film Growth In Aqueous Solution In-situ With A Combined Quartz Crystal Microbalance and Ellipsometry
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- Journal:
- MRS Online Proceedings Library Archive / Volume 1146 / 2008
- Published online by Cambridge University Press:
- 01 February 2011, 1146-NN09-02
- Print publication:
- 2008
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Terahertz Ellipsometry Using Electron-Beam Based Sources
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- Journal:
- MRS Online Proceedings Library Archive / Volume 1108 / 2008
- Published online by Cambridge University Press:
- 01 February 2011, 1108-A08-04
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- 2008
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In Situ and Ex Situ Ellipsometric Characterization of Oxygen Plasma and UV Radiation Effects on Spacecraft Materials
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- Journal:
- MRS Online Proceedings Library Archive / Volume 502 / 1997
- Published online by Cambridge University Press:
- 10 February 2011, 177
- Print publication:
- 1997
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Spectroscopic Ellipsometry and Band Structure of Si1–yCy Alloys Grown Pseudomorphically on Si (001)
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- Journal:
- MRS Online Proceedings Library Archive / Volume 379 / 1995
- Published online by Cambridge University Press:
- 15 February 2011, 205
- Print publication:
- 1995
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In-Situ Ellipsometric Monitoring of the Electron Cyclotron Resonance Etching of Diamond-Like Carbon
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- Journal:
- MRS Online Proceedings Library Archive / Volume 349 / 1994
- Published online by Cambridge University Press:
- 22 February 2011, 535
- Print publication:
- 1994
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Optical Characterization and Modeling of Amorphous Hydrogenated Carbon Films*
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- Journal:
- MRS Online Proceedings Library Archive / Volume 349 / 1994
- Published online by Cambridge University Press:
- 22 February 2011, 453
- Print publication:
- 1994
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In situ and Ex situ Applications of Spectroscopic Ellipsometry
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- Journal:
- MRS Online Proceedings Library Archive / Volume 324 / 1993
- Published online by Cambridge University Press:
- 22 February 2011, 15
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- 1993
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In Situ Studies of Electron Cyclotron Resonance Plasma Etching of Semiconductors by Spectroscopic Ellipsometry
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- Journal:
- MRS Online Proceedings Library Archive / Volume 279 / 1992
- Published online by Cambridge University Press:
- 25 February 2011, 819
- Print publication:
- 1992
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Substructure-Magnetic Property Correlation in Co/ag Composite Thin Films
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- Journal:
- MRS Online Proceedings Library Archive / Volume 231 / 1991
- Published online by Cambridge University Press:
- 26 February 2011, 329
- Print publication:
- 1991
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Optical and Magneto-optical modeling of Ultra-thin Film Multilayers
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- Journal:
- MRS Online Proceedings Library Archive / Volume 231 / 1991
- Published online by Cambridge University Press:
- 26 February 2011, 497
- Print publication:
- 1991
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Variable Angle Spectroscopic Ellipsometric Characterization of Polycrystalline Silicon thin Film Multilayer Structures
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- Journal:
- MRS Online Proceedings Library Archive / Volume 238 / 1991
- Published online by Cambridge University Press:
- 25 February 2011, 605
- Print publication:
- 1991
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Real-Time Analysis Of In-Situ Spectroscopic Ellipsometric Data During Mbe Growth Of III-V Semiconductors
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- Journal:
- MRS Online Proceedings Library Archive / Volume 222 / 1991
- Published online by Cambridge University Press:
- 16 February 2011, 75
- Print publication:
- 1991
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Atomic Oxygen Plasma Effects on CVD Deposited Diamond-Like Carbon Films*
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- Journal:
- MRS Online Proceedings Library Archive / Volume 235 / 1991
- Published online by Cambridge University Press:
- 28 February 2011, 769
- Print publication:
- 1991
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Atomic Oxygen Plasma Effects on Cvd Deposited Diamond-Like Carbon Films*
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- Journal:
- MRS Online Proceedings Library Archive / Volume 236 / 1991
- Published online by Cambridge University Press:
- 25 February 2011, 307
- Print publication:
- 1991
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In Situ Spectroscopic Ellipsometry for Real Time Semiconductor Growth Monitor†
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- Journal:
- MRS Online Proceedings Library Archive / Volume 216 / 1990
- Published online by Cambridge University Press:
- 25 February 2011, 459
- Print publication:
- 1990
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Characterization of Polysilicon Thin Films by Variable Angle Spectroscopic Ellipsometry
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- Journal:
- MRS Online Proceedings Library Archive / Volume 182 / 1990
- Published online by Cambridge University Press:
- 21 February 2011, 219
- Print publication:
- 1990
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GaAs(100) Surface Modifications at Elevated Temperatures, Studied By In-Situ Spectroscopic Ellipsometry
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- Journal:
- MRS Online Proceedings Library Archive / Volume 202 / 1990
- Published online by Cambridge University Press:
- 25 February 2011, 339
- Print publication:
- 1990
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Studies of the Early Oxidation of Silicon (111) in Atomic Oxygen*
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- Journal:
- MRS Online Proceedings Library Archive / Volume 163 / 1989
- Published online by Cambridge University Press:
- 25 February 2011, 965
- Print publication:
- 1989
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