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Optical and Magneto-optical modeling of Ultra-thin Film Multilayers

Published online by Cambridge University Press:  26 February 2011

William A McGahan
Affiliation:
Center for Microelectronic and Optical materials research and, Department of Electrical Engineering and physics,, University of Nebraska-lincoln, Lincoln NE 65808
Ping He
Affiliation:
Center for Microelectronic and Optical materials research and, Department of Electrical Engineering and physics,, University of Nebraska-lincoln, Lincoln NE 65808
John A Woollam
Affiliation:
Center for Microelectronic and Optical materials research and, Department of Electrical Engineering and physics,, University of Nebraska-lincoln, Lincoln NE 65808
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Abstract

A Method for calculation of the optical and magneto-optical response of multilayered structures in which the layers are atomically thick is presented. The method can be used to calculate the response of any flim which has arbitrary compositional varaiation in the direction normal to the film plane as well. Calculations are presented for Tb/Co compositionally modulated alloys.

Type
Research Article
Copyright
Copyright © Materials Research Society 1992

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References

1. McGahan, William A. and Woollam, John A., Appl. Phys. Comm, 9(1&2), 1 (1989).Google Scholar