16 results
Understanding the effect of impurities and grain boundaries on mechanical behavior of Si via nanoindentation of (110)/(100) direct Si bonded wafers
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- Journal:
- Journal of Materials Research / Volume 27 / Issue 1 / 14 January 2012
- Published online by Cambridge University Press:
- 27 September 2011, pp. 349-355
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- 14 January 2012
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Evaluating Amorphization Around Micro-Cracks in PV Silicon
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- Journal:
- MRS Online Proceedings Library Archive / Volume 1210 / 2009
- Published online by Cambridge University Press:
- 31 January 2011, 1210-Q05-08
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- 2009
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Deep Level Transient Spectroscopy Study of Dislocations in SiGe/Si Heterostructures
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- MRS Online Proceedings Library Archive / Volume 994 / 2007
- Published online by Cambridge University Press:
- 01 February 2011, 0994-F09-04
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- 2007
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Reliable Local Strain Characterization on Si/SiGe Structures in Biaxial Tension
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- MRS Online Proceedings Library Archive / Volume 958 / 2006
- Published online by Cambridge University Press:
- 01 February 2011, 0958-L04-08
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- 2006
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Simulation and Electron Energy-Loss Spectroscopy of Electron Beam Induced Point Defect Agglomerations in Silicon
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- MRS Online Proceedings Library Archive / Volume 810 / 2004
- Published online by Cambridge University Press:
- 17 March 2011, C3.9
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- 2004
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Lateral Diffusion and Capture of Iron in P-Type Silicon
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- Journal:
- MRS Online Proceedings Library Archive / Volume 378 / 1995
- Published online by Cambridge University Press:
- 26 February 2011, 291
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- 1995
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Capillary Instabilities in Cobalt Silicide Thin Films
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- Journal:
- MRS Online Proceedings Library Archive / Volume 355 / 1994
- Published online by Cambridge University Press:
- 21 February 2011, 593
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- 1994
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Phase Transformation of Co Silicidation in the Co/Ti- and Ti/Co-Si(100) Systems
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- Journal:
- MRS Online Proceedings Library Archive / Volume 311 / 1993
- Published online by Cambridge University Press:
- 21 February 2011, 305
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- 1993
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Solid State Interaction and Nano-Scale Silicide Formation for Co/Ti Multilayers on Silicon
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- Journal:
- MRS Online Proceedings Library Archive / Volume 260 / 1992
- Published online by Cambridge University Press:
- 25 February 2011, 187
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- 1992
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Interfacial Morphology of Selicides Formed Via Rta of Sputtered Bi- and Multi-Layer Co/Ti(O,C) on Si
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- Journal:
- MRS Online Proceedings Library Archive / Volume 280 / 1992
- Published online by Cambridge University Press:
- 25 February 2011, 533
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- 1992
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The Gettering and Electrical Activity of Ni, Au, and Cu in Epitaxial Si/Si(2%Ge)/Si during RTA
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- Journal:
- MRS Online Proceedings Library Archive / Volume 224 / 1991
- Published online by Cambridge University Press:
- 28 February 2011, 55
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- 1991
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CoSi2 Formation Through Co/Ti Multilayer Reacting with Si-(100) Substrate
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- MRS Online Proceedings Library Archive / Volume 238 / 1991
- Published online by Cambridge University Press:
- 25 February 2011, 587
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- 1991
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Temperature Dependent Recombination Lifetime in Silicon: Influence of Trap Level
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- MRS Online Proceedings Library Archive / Volume 209 / 1990
- Published online by Cambridge University Press:
- 26 February 2011, 567
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- 1990
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Delineation of p-n Junctions on Cross Sectional TEM Device Samples
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- Journal:
- MRS Online Proceedings Library Archive / Volume 199 / 1990
- Published online by Cambridge University Press:
- 16 February 2011, 299
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- 1990
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Hydrogen Induced Defects at Silicon Surfaces and Buried Epitaxial Misfit Dislocation Interfaces
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- MRS Online Proceedings Library Archive / Volume 163 / 1989
- Published online by Cambridge University Press:
- 25 February 2011, 449
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- 1989
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Point Defect Engineering Applied to Shallow Junction ULSI Processing
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- MRS Online Proceedings Library Archive / Volume 147 / 1989
- Published online by Cambridge University Press:
- 21 February 2011, 3
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- 1989
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