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The effects of conversion parameters on transport properties of YBa2Cu3O7-δ (YBCO) films on rolling assisted biaxially textured substrates (RABiTS) in the BaF2 ex situ process were investigated for total pressures Ptotal between 0.1 and 1.3 atm, water vapor pressures PH2O between approximately 7 and 70 Torr and processing temperatures TS between 700 and 790 °C. For this study, a 0.3-μm-thick Y–BaF2–Cu–O precursor film was deposited on a 1-cm-wide Ni=3 at.% W RABiTS with a buffer layer architecture of CeO2/YSZ/Y2O3/Ni deposited in single passes in various reel-to-reel systems for each layer. Under the conditions of Ptotal = 0.1 atm, TS = 740 °C and PO2 approximately 150 mTorr, JC > 2 MA/cm2 was obtained at 77 K and self field for PH2O ≤ 20 Torr. At higher PH2O (=70 Torr), however, the maximum attainable JC decreased. In addition, the JC at these higher PH2O dropped rapidly with increased dwell time. The highest JC, 2.5 MA/cm2, was achieved at 730 °C with Ptotal = 0.1 atm and PH2O approximately 7 Torr. Finally, the variation of IC with wet conversion time was performed at each processing temperature.
The electron backscattering pattern technique has been applied to the microstructural investigation of Tl(1223) thick films formed by vapor-phase thallination of Ag-containing Ba–Ca–Cu–oxide precursors. For samples grown on polycrystalline YSZ, considerable biaxial alignment is found in localized, multigrain regions as wide a 100 μm or more. However, on scales above 1 mm the overall texture remains only uniaxial with the c-axes (i.e., ) aligned perpendicular to the plane of the substrate. On single-crystal KTaO3 an epitaxial relationship is evident which persists to the surface of a 3 μm thick film. Modest variations in the processing protocol yield films containing grains oriented with the c-axis in the plane, resulting in the degradation of transport properties. The data suggest a growth mode in which sparse nucleation occurs at the substrate followed by rapid lateral crystallization.
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