Hostname: page-component-848d4c4894-sjtt6 Total loading time: 0 Render date: 2024-06-21T09:22:01.051Z Has data issue: false hasContentIssue false

Effects of Conversion Parameters on the Transport Properties of YBCO Films in the BaF2 Ex Situ Process

Published online by Cambridge University Press:  03 March 2011

J. Yoo*
Affiliation:
Oak Ridge National Laboratory, Oak Ridge, Tennessee 37831
K.J. Leonard
Affiliation:
Oak Ridge National Laboratory, Oak Ridge, Tennessee 37831
D.F. Lee
Affiliation:
Oak Ridge National Laboratory, Oak Ridge, Tennessee 37831
H.S. Hsu
Affiliation:
Oak Ridge National Laboratory, Oak Ridge, Tennessee 37831
L. Heatherly
Affiliation:
Oak Ridge National Laboratory, Oak Ridge, Tennessee 37831
F.A. List
Affiliation:
Oak Ridge National Laboratory, Oak Ridge, Tennessee 37831
N.A. Rutter
Affiliation:
Oak Ridge National Laboratory, Oak Ridge, Tennessee 37831
A. Goyal
Affiliation:
Oak Ridge National Laboratory, Oak Ridge, Tennessee 37831
M. Paranthaman
Affiliation:
Oak Ridge National Laboratory, Oak Ridge, Tennessee 37831
D.M. Kroeger
Affiliation:
Oak Ridge National Laboratory, Oak Ridge, Tennessee 37831
*
a)Address all correspondence to this author. e-mail: yooj@ornl.gov
Get access

Abstract

The effects of conversion parameters on transport properties of YBa2Cu3O7-δ (YBCO) films on rolling assisted biaxially textured substrates (RABiTS) in the BaF2 ex situ process were investigated for total pressures Ptotal between 0.1 and 1.3 atm, water vapor pressures PH2O between approximately 7 and 70 Torr and processing temperatures TS between 700 and 790 °C. For this study, a 0.3-μm-thick Y–BaF2–Cu–O precursor film was deposited on a 1-cm-wide Ni=3 at.% W RABiTS with a buffer layer architecture of CeO2/YSZ/Y2O3/Ni deposited in single passes in various reel-to-reel systems for each layer. Under the conditions of Ptotal = 0.1 atm, TS = 740 °C and PO2 approximately 150 mTorr, JC > 2 MA/cm2 was obtained at 77 K and self field for PH2O ≤ 20 Torr. At higher PH2O (=70 Torr), however, the maximum attainable JC decreased. In addition, the JC at these higher PH2O dropped rapidly with increased dwell time. The highest JC, 2.5 MA/cm2, was achieved at 730 °C with Ptotal = 0.1 atm and PH2O approximately 7 Torr. Finally, the variation of IC with wet conversion time was performed at each processing temperature.

Type
Articles
Copyright
Copyright © Materials Research Society 2004

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

REFERENCES

1Iijima, Y., Tanabe, N., Kono, O. and Ikeno, Y.: Appl. Phys. Lett. 60, 769 (1992).Google Scholar
2Wu, X.D., Foltyn, S.R., Arendt, P.N., Blumenthal, W.R., Cambell, I.H., Cotton, J.D., Coulter, J.Y., Hults, W.L., Maley, M.P., Safar, H.F. and Smith, J.L.: Appl. Phys. Lett. 67, 2397 (1995).Google Scholar
3Goyal, A., Norton, D.P., Budai, J.D., Paranthaman, M., Specht, E.D., Kroeger, D.M., Christen, D.K., He, Q., Saffian, B., List, F.A., Lee, D.F., Martin, P.M., Klabunde, C.E., Hatfield, E. and Sikka, V.K.: Appl. Phys. Lett. 69, 1795 (1996).CrossRefGoogle Scholar
4Norton, D.P., Goyal, A., Budai, J.D., Christen, D.K., Kroeger, D.M., Specht, E.D., He, Q., Saffian, B., Paranthaman, M., Klabunde, C.E., Lee, D.F., Sales, B.C. and List, F.A.: Science. 274, 755 (1996).CrossRefGoogle Scholar
5Hasegawa, K., Yoshida, N., Hujino, K., Mukai, K., Hayashi, K., Sato, K., Sato, Y., Honjo, S., Ohkuma, T., Ishii, H., and Hara, T.: in Advances in Superconductivity IX, Proceedings of the 9th International Symposium on Superconductivity (ISS ’96), edited by Nakajima, S. and Murakami, M. (Springer-Verlag, Tokyo, Japan, 1997) pp. 745748.Google Scholar
6Bauer, M., Semerad, R. and Kinder, H.: IEEE Trans. Appl. Phys. Supercond. 9, 1502 (1999).CrossRefGoogle Scholar
7Feenstra, R., Christen, D.K., and Paranthaman, M.: U.S. Patent No. 5 972 847.Google Scholar
8Solovyov, V.F., Wiesmann, H.J., Wu, Li-Jun, Suenaga, M. and Feenstra, R.: IEEE Trans. Appl. Supercond. 9, 1467 (1999).CrossRefGoogle Scholar
9Paranthaman, M., Park, C., Cui, X., Goyal, A., Lee, D.F., Martin, P.M., Chirayil, T.G., Verebelyi, D.T., Norton, D.P., Christen, D.K. and Kroeger, D.M.: J. Mater. Res. 15, 2647 (2000).CrossRefGoogle Scholar
10McIntyre, P.C., Cima, M.J. and Ng, M.F.: J. Appl. Phys. 68, 4183 (1990).CrossRefGoogle Scholar
11Solovyov, V.F., Wiesmann, H.J., and Suenaga, M.: S4I-1, The 2001 International Workshop on Superconductivity Cosponsored by ISTEC and MRS, Honolulu, HI, June 24–27, 2001.Google Scholar
12Yoshizumi, M., Seleznev, I., and Cima, M.J.: Crystal Growth of YBCO Coated Conductor Under Low Pressure, DOE Wire Workshop, Jan. 21–22, 2003.Google Scholar
13List, F.A., Specht, E.D., Heatherly, L., Leonard, K.J., Sathyamurthy, S. and Kroeger, D.M.: Physica C. 391, 350 (2003).CrossRefGoogle Scholar
14Cui, X., List, F.A., Kroeger, D.M., Goyal, A., Lee, D.F., Mathis, J., Specht, E.D., Martin, P.M., Feenstra, R., Verebeli, D.T., Christen, D.K. and Paranthaman, M.: Physica C. 316, 27 (1992).CrossRefGoogle Scholar
15Rutter, N.A., Goyal, A., Vallet, C.E., F.A. List III, D.F. Lee, and L. Heatherly, and D.M. Kroeger: (2003, unpublished).Google Scholar
16Heatherly, L., et al: (unpublished)Google Scholar
17 J. Yoo, K.J. Leonard, D.F. Lee, H.S. Hsu, L. Heatherly, F.A. List III, P.M. Martin, and D.M. Kroeger: Geometrical and Pressure Effects on Uniformity of YBCO Conversion in BaF2 Ex-Situ Process, International Workshop on Processing and application of superconductors, Park Vista Hotel, Gatlinburg, TN, July 31–August 2, 2002.Google Scholar
18Solovyov, V.F., Wiesmann, H.J., Wu, L., Zhu, Y. and Suenaga, M.: IEEE Trans. Appl. Supercond. 11, 2939 (2001).Google Scholar
19Solovyov, V.F., Wiesmann, H.J., Wu, L., Zhu, Y. and Suenaga, M.: Appl. Phys. Lett. 76, 1911 (2000).CrossRefGoogle Scholar
20Verebelyi, D.T., Christen, D.K., Feenstra, R., Cantoni, C., Goyal, A., Lee, D.F., Paranthaman, M., Arendt, P.N., DePaula, R.F., Groves, J.R. and Prouteau, C.: Appl. Phys. Lett. 76, 1755 (2000).CrossRefGoogle Scholar
21Leonard, K.J., Goyal, A., Kroeger, D.M., Jones, J.W., Kang, S., Rutter, N.A., Paranthaman, M., Lee, D.F. and Kang, B.W.: J. Mater. Res. 18, 1109 (2003).CrossRefGoogle Scholar
22 D.F. Lee, et al: to be published.Google Scholar