21 results
Chemical Shift Detection with Energy Dispersive Spectroscopy (EDS)
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- Journal:
- Microscopy and Microanalysis / Volume 27 / Issue S1 / August 2021
- Published online by Cambridge University Press:
- 30 July 2021, pp. 2068-2069
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- August 2021
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In Situ Visualization of the Electron Wind Force in the Elastic Regime
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- Microscopy and Microanalysis / Volume 27 / Issue S1 / August 2021
- Published online by Cambridge University Press:
- 30 July 2021, pp. 106-107
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- August 2021
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Modern STEM EBIC: Emerging Modes and Methods
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- Microscopy and Microanalysis / Volume 27 / Issue S1 / August 2021
- Published online by Cambridge University Press:
- 30 July 2021, pp. 2350-2352
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- August 2021
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In Situ STEM Observations of Elemental Segregation in Phase Change Material GST Under Electrical and Thermal Stress
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- Microscopy and Microanalysis / Volume 27 / Issue S1 / August 2021
- Published online by Cambridge University Press:
- 30 July 2021, pp. 168-169
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- August 2021
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Electrical Isolation Preserved by Plasma Focused Ion Beam TEM Sample Preparation and Verified with STEM SEEBIC Imaging
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- Microscopy and Microanalysis / Volume 26 / Issue S2 / August 2020
- Published online by Cambridge University Press:
- 30 July 2020, pp. 194-195
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- August 2020
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Fingerprinting the Phases of Thin Film Ge2Sb2Te5 with EELS
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- Microscopy and Microanalysis / Volume 26 / Issue S2 / August 2020
- Published online by Cambridge University Press:
- 30 July 2020, pp. 904-905
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- August 2020
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Correlation of Joule Heating and Electromigration-induced Mass Transport within Nanoscale Co Interconnects by In Situ STEM
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- Microscopy and Microanalysis / Volume 26 / Issue S2 / August 2020
- Published online by Cambridge University Press:
- 30 July 2020, pp. 152-154
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- August 2020
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Inducing Electrically-Active Defects in a Gallium Arsenide Nanowire with an Electron Beam
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- Microscopy and Microanalysis / Volume 25 / Issue S2 / August 2019
- Published online by Cambridge University Press:
- 05 August 2019, pp. 1618-1619
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- August 2019
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Total Electron Yield Mapping of Electronic Device Features via Measurement of X-Ray Beam-Induced Currents
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- Microscopy and Microanalysis / Volume 25 / Issue S2 / August 2019
- Published online by Cambridge University Press:
- 05 August 2019, pp. 256-257
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- August 2019
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Mapping Electronic State Changes with STEM EBIC
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- Journal:
- Microscopy and Microanalysis / Volume 25 / Issue S2 / August 2019
- Published online by Cambridge University Press:
- 05 August 2019, pp. 1396-1397
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- August 2019
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Electromigration of Copper in Lithographically-Defined Aluminum Nanowires
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- Microscopy and Microanalysis / Volume 24 / Issue S1 / August 2018
- Published online by Cambridge University Press:
- 01 August 2018, pp. 2190-2191
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- August 2018
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STEM EBIC Mapping of the Metal-Insulator Transition in Thin-film NbO2
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- Microscopy and Microanalysis / Volume 23 / Issue S1 / July 2017
- Published online by Cambridge University Press:
- 04 August 2017, pp. 1428-1429
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- July 2017
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Detailed In Situ Observations of Electromigration in Aluminum Wires
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- Microscopy and Microanalysis / Volume 23 / Issue S1 / July 2017
- Published online by Cambridge University Press:
- 04 August 2017, pp. 1450-1451
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- July 2017
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In Situ Observation of Cooling in a Bismuth Telluride and Bismuth-Antimony Telluride Nanoscale Heterojunction
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- Microscopy and Microanalysis / Volume 23 / Issue S1 / July 2017
- Published online by Cambridge University Press:
- 04 August 2017, pp. 1996-1997
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- July 2017
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Plasmon Energy Mapping in Aluminum and Indium with Sub-Nanometer Resolution
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- Microscopy and Microanalysis / Volume 23 / Issue S1 / July 2017
- Published online by Cambridge University Press:
- 04 August 2017, pp. 378-379
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- July 2017
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Temperature Dependence of the Silicon Nitride Volume Plasmon
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- Microscopy and Microanalysis / Volume 22 / Issue S3 / July 2016
- Published online by Cambridge University Press:
- 25 July 2016, pp. 1574-1575
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- July 2016
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Aloof Beam Plasmons in Silver Nanoparticles
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- Microscopy and Microanalysis / Volume 22 / Issue S3 / July 2016
- Published online by Cambridge University Press:
- 25 July 2016, pp. 1642-1643
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- July 2016
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Aluminum Nanoparticles as Fiducials for Nanoscale Temperature Measurements
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- Microscopy and Microanalysis / Volume 22 / Issue S3 / July 2016
- Published online by Cambridge University Press:
- 25 July 2016, pp. 830-831
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- July 2016
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Temperature Dependence of the Volume Plasmon in Silicon Nanoparticles
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- Microscopy and Microanalysis / Volume 22 / Issue S3 / July 2016
- Published online by Cambridge University Press:
- 25 July 2016, pp. 296-297
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- July 2016
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Asymmetric Temperature Profiles in Joule-Heated in Aluminum Nanowires
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- Journal:
- Microscopy and Microanalysis / Volume 22 / Issue S3 / July 2016
- Published online by Cambridge University Press:
- 25 July 2016, pp. 772-773
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- July 2016
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