60 results
A Roadmap for Edge Computing Enabled Automated Multidimensional Transmission Electron Microscopy
- Journal: Microscopy Today / Volume 30 / Issue 6 / November 2022
- Published online by Cambridge University Press: 24 November 2022, pp. 10-19
- Print publication: November 2022
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Atomic-scale Fabrication of 1D-2D Nano Hetero-structures within 2D Materials through Automated Tracking and Electron Beam Control
- Journal: Microscopy and Microanalysis / Volume 28 / Issue S1 / August 2022
- Published online by Cambridge University Press: 22 July 2022, pp. 2178-2180
- Print publication: August 2022
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Seamless Communication Between High-Performance Computing System and Electron Microscopes for On-Demand Automated Data Transfer and Remote Control
- Journal: Microscopy and Microanalysis / Volume 28 / Issue S1 / August 2022
- Published online by Cambridge University Press: 22 July 2022, pp. 2908-2910
- Print publication: August 2022
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Automatic and Quantitative Measurement of Spectrometer Aberrations in Monochromated EELS
- Journal: Microscopy and Microanalysis / Volume 28 / Issue S1 / August 2022
- Published online by Cambridge University Press: 22 July 2022, pp. 3108-3110
- Print publication: August 2022
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Contrast Mechanisms in Secondary Electron e-Beam-Induced Current (SEEBIC) Imaging
- Journal: Microscopy and Microanalysis / Volume 28 / Issue 5 / October 2022
- Published online by Cambridge University Press: 30 May 2022, pp. 1567-1583
- Print publication: October 2022
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Atomic-scale Feedback-controlled Electron Beam Fabrication of 2D Materials
- Journal: Microscopy and Microanalysis / Volume 27 / Issue S1 / August 2021
- Published online by Cambridge University Press: 30 July 2021, pp. 3072-3073
- Print publication: August 2021
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A STEM/EELS study of interfaces in delafossite-based quantum heterostructures
- Journal: Microscopy and Microanalysis / Volume 27 / Issue S1 / August 2021
- Published online by Cambridge University Press: 30 July 2021, pp. 1208-1209
- Print publication: August 2021
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Automatic detection of crystallographic defects in STEM images by unsupervised learning with translational invariance
- Journal: Microscopy and Microanalysis / Volume 27 / Issue S1 / August 2021
- Published online by Cambridge University Press: 30 July 2021, pp. 1460-1462
- Print publication: August 2021
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Electron Beam Control of Dopants in 2D and 3D Materials
- Journal: Microscopy and Microanalysis / Volume 27 / Issue S1 / August 2021
- Published online by Cambridge University Press: 30 July 2021, pp. 2150-2153
- Print publication: August 2021
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Cryogenic Atomic Resolution and 4D STEM Imaging for Energy and Quantum Materials
- Journal: Microscopy and Microanalysis / Volume 27 / Issue S1 / August 2021
- Published online by Cambridge University Press: 30 July 2021, pp. 384-385
- Print publication: August 2021
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Probing atomic-scale symmetry breaking by rotationally invariant machine learning of 4D-STEM Data.
- Journal: Microscopy and Microanalysis / Volume 27 / Issue S1 / August 2021
- Published online by Cambridge University Press: 30 July 2021, pp. 2200-2201
- Print publication: August 2021
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From Control of the Electron Beam to Control of Single Atoms
- Journal: Microscopy and Microanalysis / Volume 25 / Issue S2 / August 2019
- Published online by Cambridge University Press: 05 August 2019, pp. 1678-1679
- Print publication: August 2019
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A STEM-based Path Towards Atomic-scale Silicon-based Devices
- Journal: Microscopy and Microanalysis / Volume 25 / Issue S2 / August 2019
- Published online by Cambridge University Press: 05 August 2019, pp. 2290-2291
- Print publication: August 2019
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Lab on a beam—Big data and artificial intelligence in scanning transmission electron microscopy
- Journal: MRS Bulletin / Volume 44 / Issue 7 / July 2019
- Published online by Cambridge University Press: 12 July 2019, pp. 565-575
- Print publication: July 2019
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Towards topological spectroscopy in the electron microscope with atomic resolution
- Journal: Microscopy and Microanalysis / Volume 24 / Issue S1 / August 2018
- Published online by Cambridge University Press: 01 August 2018, pp. 926-927
- Print publication: August 2018
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Direct Imaging of Low-Dimensional Nanostructures
- Journal: Microscopy and Microanalysis / Volume 24 / Issue S1 / August 2018
- Published online by Cambridge University Press: 01 August 2018, pp. 90-91
- Print publication: August 2018
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Temperature Measurement by a Nanoscale Electron Probe using Energy Gain and Loss Spectroscopy
- Journal: Microscopy and Microanalysis / Volume 24 / Issue S1 / August 2018
- Published online by Cambridge University Press: 01 August 2018, pp. 98-99
- Print publication: August 2018
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Towards Atomic-Scale Fabrication in Silicon
- Journal: Microscopy and Microanalysis / Volume 24 / Issue S1 / August 2018
- Published online by Cambridge University Press: 01 August 2018, pp. 158-159
- Print publication: August 2018
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Atomic Manipulation on a Scanning Transmission Electron Microscope Platform using Real-Time Image Processing and Feedback
- Journal: Microscopy and Microanalysis / Volume 24 / Issue S1 / August 2018
- Published online by Cambridge University Press: 01 August 2018, pp. 534-535
- Print publication: August 2018
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Automated Atom-by-Atom Assembly of Structures in Graphene: The Rise of STEM for Atomic Scale Control
- Journal: Microscopy and Microanalysis / Volume 24 / Issue S1 / August 2018
- Published online by Cambridge University Press: 01 August 2018, pp. 1594-1595
- Print publication: August 2018
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