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Towards topological spectroscopy in the electron microscope with atomic resolution

Published online by Cambridge University Press:  01 August 2018

Juan Carlos Idrobo
Affiliation:
Center for Nanophase Materials Sciences, Oak Ridge National Laboratory, Oak Ridge, TN, USA.
Andrew R. Lupini
Affiliation:
Materials Science and Technology Division, Oak Ridge National Laboratory, Oak Ridge, TN, USA.
Tracy C. Lovejoy
Affiliation:
Nion Company, 11511 NE 118th St, Kirkland, WA, USA.
Nickolay V. Lavrik
Affiliation:
Center for Nanophase Materials Sciences, Oak Ridge National Laboratory, Oak Ridge, TN, USA.
Jordan A. Hachtel
Affiliation:
Center for Nanophase Materials Sciences, Oak Ridge National Laboratory, Oak Ridge, TN, USA.
Ján Rusz
Affiliation:
Department of Physics and Astronomy, Uppsala University, Box 516, S-751 20 Uppsala, Sweden
Niklas Dellby
Affiliation:
Nion Company, 11511 NE 118th St, Kirkland, WA, USA.
Ondrej L. Krivanek
Affiliation:
Nion Company, 11511 NE 118th St, Kirkland, WA, USA.
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Abstract

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© Microscopy Society of America 2018 

References

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[9] Rusz, J Idrobo, JC Phys. Rev. B 94 2016) p 144430.CrossRefGoogle Scholar
[10] Research supported by ORNL’s Center for Nanophase Materials Sciences, which is a U.S. Department of Energy Office of Science User Facility (J.C.I. and J.A.H.), and the Materials Sciences and Engineering Division, Office of Basic Energy Sciences, U.S. Department of Energy (A.R.L.), by ORNL’s Laboratory Directed Research and Development Program, managed by UT-Battelle, LLC, for the U.S. Department of Energy (J.C.I. A.R.L., J.A.H., N.V.L.), and instrumentation within ORNL’s Materials Characterization Core provided by UT-Battelle, LLC under Contract No. DE-AC05-00OR22725 with the U.S. Department of Energy. J.R. acknowledges funding from Swedish Research Council, Göran Gustafsson's foundation and Carl Tryggers foundation.Google Scholar
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