6 results
Residual Stress in Silicon Nitride Thin Films Deposited by ECR-PECVD
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- Journal:
- MRS Online Proceedings Library Archive / Volume 795 / 2003
- Published online by Cambridge University Press:
- 01 February 2011, U11.4
- Print publication:
- 2003
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A Novel Two-Pass Excimer Laser Crystallization Process to Obtain Homogeneous Large Grain Polysilicon
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- Journal:
- MRS Online Proceedings Library Archive / Volume 558 / 1999
- Published online by Cambridge University Press:
- 10 February 2011, 175
- Print publication:
- 1999
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Spm Based Lithography for Nanometer Scale Electrodes Fabrication
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- Journal:
- MRS Online Proceedings Library Archive / Volume 584 / 1999
- Published online by Cambridge University Press:
- 10 February 2011, 319
- Print publication:
- 1999
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Properties and Stability of Bismuth Doped Tin Oxide Thin Films Deposited on Various Types of Glass Substrates
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- Journal:
- MRS Online Proceedings Library Archive / Volume 424 / 1996
- Published online by Cambridge University Press:
- 10 February 2011, 355
- Print publication:
- 1996
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Improved Spray-Pyrolysis Deposition System for Polycrystalline Conductive SnO2 Thin Films
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- Journal:
- MRS Online Proceedings Library Archive / Volume 403 / 1995
- Published online by Cambridge University Press:
- 15 February 2011, 435
- Print publication:
- 1995
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Instability in a-Si:H Thin-Film Transistor: A New Method to Discriminate Between Charge Injection and Defect Creation
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- Journal:
- MRS Online Proceedings Library Archive / Volume 258 / 1992
- Published online by Cambridge University Press:
- 21 February 2011, 1019
- Print publication:
- 1992
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