7 results
S41 Application of X-ray Diffraction Stress Analysis at Constant Penetration Depth for the Determination of Both Real-Space Residual-Stress and Lattice-Parameter Gradients
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- Journal:
- Powder Diffraction / Volume 23 / Issue 2 / June 2008
- Published online by Cambridge University Press:
- 20 May 2016, p. 182
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D-36 Grain Growth and Texture Sharpening in Copper, Nickel and Palladium Thin Films, Investigated by Non-Ambient X-ray Diffraction Measurements
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- Journal:
- Powder Diffraction / Volume 23 / Issue 2 / June 2008
- Published online by Cambridge University Press:
- 20 May 2016, p. 174
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Grain growth in nanocrystalline copper thin films investigated by non-ambient X-ray diffraction measurements
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- Journal:
- Powder Diffraction / Volume 24 / Issue 2 / June 2009
- Published online by Cambridge University Press:
- 20 May 2016, pp. 85-88
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S22 Invited—Diffraction Analysis of Stress Gradients in Tin Thin Films: An Explanation for the Occurrence of Whisker Formation?
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- Journal:
- Powder Diffraction / Volume 23 / Issue 2 / June 2008
- Published online by Cambridge University Press:
- 20 May 2016, p. 185
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Evolution of microstructure and stress of and associated whisker growth on Sn layers sputter-deposited on Cu substrates
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- Journal:
- Journal of Materials Research / Volume 25 / Issue 11 / November 2010
- Published online by Cambridge University Press:
- 31 January 2011, pp. 2166-2174
- Print publication:
- November 2010
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Residual stress and strain-free lattice-parameter depth profiles in a γ′-Fe4N1-x layer on an α-Fe substrate measured by x-ray diffraction stress analysis at constant information depth
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- Journal:
- Journal of Materials Research / Volume 24 / Issue 4 / April 2009
- Published online by Cambridge University Press:
- 31 January 2011, pp. 1342-1352
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- April 2009
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X-Ray Diffraction and Reflectometry Investigation of Interdiffusion In Sputtered Niobium-Tungsten Bilayers
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- Journal:
- MRS Online Proceedings Library Archive / Volume 562 / 1999
- Published online by Cambridge University Press:
- 10 February 2011, 147
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- 1999
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