22 results
Electron Backscatter Diffraction Analysis of Beam Sensitive Samples Using Direct Detection Technology
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- Journal:
- Microscopy and Microanalysis / Volume 28 / Issue S1 / August 2022
- Published online by Cambridge University Press:
- 22 July 2022, pp. 2190-2191
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- August 2022
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Low dose EBSD analysis of biominerals
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- Microscopy and Microanalysis / Volume 27 / Issue S1 / August 2021
- Published online by Cambridge University Press:
- 30 July 2021, pp. 268-269
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- August 2021
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HR-EBSD based Characterization of Dislocations in Additive Manufactured 316L Stainless Steel
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- Microscopy and Microanalysis / Volume 27 / Issue S1 / August 2021
- Published online by Cambridge University Press:
- 30 July 2021, pp. 2670-2672
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- August 2021
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Applications of Direct Electron Detection to the EBSD Analysis of Energy Conversion and Storage Materials
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- Microscopy and Microanalysis / Volume 27 / Issue S1 / August 2021
- Published online by Cambridge University Press:
- 30 July 2021, p. 3434
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- August 2021
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Real World Application of EBSD Forward Models
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- Microscopy and Microanalysis / Volume 27 / Issue S1 / August 2021
- Published online by Cambridge University Press:
- 30 July 2021, pp. 40-43
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- August 2021
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Children and innovation: play, play objects and object play in cultural evolution
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- Evolutionary Human Sciences / Volume 3 / 2021
- Published online by Cambridge University Press:
- 05 February 2021, e11
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Correlating Complementary Data for Improving Electron Backscatter Diffraction (EBSD) Microstructural Characterization of Geological Materials
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- Microscopy and Microanalysis / Volume 23 / Issue S1 / July 2017
- Published online by Cambridge University Press:
- 04 August 2017, pp. 2166-2167
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- July 2017
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Thoughts on Standards Materials and Analytical Routines for Electron Backscatter Diffraction (EBSD)
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- Microscopy and Microanalysis / Volume 23 / Issue S1 / July 2017
- Published online by Cambridge University Press:
- 04 August 2017, pp. 510-511
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- July 2017
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Scientific Analysis of NPAR Processing of EBSD Results for Beam-Sensitive Materials
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- Microscopy and Microanalysis / Volume 23 / Issue S1 / July 2017
- Published online by Cambridge University Press:
- 04 August 2017, pp. 1836-1837
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- July 2017
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Improved EBSD Map Fidelity through Re-indexing of Neighbor Averaged Patterns
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- Microscopy and Microanalysis / Volume 21 / Issue S3 / August 2015
- Published online by Cambridge University Press:
- 23 September 2015, pp. 2373-2374
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- August 2015
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New Technology and Approaches for the Acceleration and Enhancement of Microstructural Characterization using Electron Backscatter Diffraction
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- Microscopy and Microanalysis / Volume 21 / Issue S3 / August 2015
- Published online by Cambridge University Press:
- 23 September 2015, pp. 1173-1174
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- August 2015
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Characterization of Sputtered CdTe Thin Films with Electron Backscatter Diffraction and Correlation with Device Performance
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- Microscopy and Microanalysis / Volume 21 / Issue 4 / August 2015
- Published online by Cambridge University Press:
- 16 June 2015, pp. 927-935
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- August 2015
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A New Microstructural Imaging Approach through EBSD Pattern Region of Interest Analysis
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- Microscopy and Microanalysis / Volume 20 / Issue S3 / August 2014
- Published online by Cambridge University Press:
- 27 August 2014, pp. 1116-1117
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- August 2014
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Advances in Scattered Electron Intensity Distribution Imaging for Microstructural Visualization and Correlations with EBSD Measurements
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- Microscopy and Microanalysis / Volume 20 / Issue S3 / August 2014
- Published online by Cambridge University Press:
- 27 August 2014, pp. 856-857
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- August 2014
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New Tools for the Study of Deformed and Heat-Treated Materials via Electron Backscatter Diffraction
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- Microscopy and Microanalysis / Volume 20 / Issue S3 / August 2014
- Published online by Cambridge University Press:
- 27 August 2014, pp. 1482-1483
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- August 2014
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Orientation Precision of Electron Backscatter Diffraction Measurements Near Grain Boundaries
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- Microscopy and Microanalysis / Volume 20 / Issue 3 / June 2014
- Published online by Cambridge University Press:
- 28 February 2014, pp. 852-863
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- June 2014
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A Review of Strain Analysis Using Electron Backscatter Diffraction
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- Microscopy and Microanalysis / Volume 17 / Issue 3 / June 2011
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- 22 March 2011, pp. 316-329
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- June 2011
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Lapita Migrants in the Pacific's Oldest Cemetery: Isotopic Analysis at Teouma, Vanuatu
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- American Antiquity / Volume 72 / Issue 4 / October 2007
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- 20 January 2017, pp. 645-656
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- October 2007
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Multi-Length Scale Characterization of the Gibeon Meteorite using Electron Backscatter Diffraction
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- Microscopy Today / Volume 15 / Issue 5 / September 2007
- Published online by Cambridge University Press:
- 14 March 2018, pp. 6-11
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- September 2007
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Recent Advances in High-Speed Orientation Mapping
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- Microscopy Today / Volume 14 / Issue 6 / November 2006
- Published online by Cambridge University Press:
- 14 March 2018, pp. 6-9
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- November 2006
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