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Correlating Complementary Data for Improving Electron Backscatter Diffraction (EBSD) Microstructural Characterization of Geological Materials

Published online by Cambridge University Press:  04 August 2017

Matthew M. Nowell ,
Shawn W. Wallace ,
Jens Rafaelsen ,
Tara L. Nylese ,
René de Kloe  and
Stuart I. Wright
Matthew M. Nowell
Affiliation:
EDAX, A Division of Ametek, Materials Analysis Division, Draper UTUSA
Shawn W. Wallace
Affiliation:
EDAX, A Division of Ametek, Materials Analysis Division, Mahwah NJUSA
Jens Rafaelsen
Affiliation:
EDAX, A Division of Ametek, Materials Analysis Division, Mahwah NJUSA
Tara L. Nylese
Affiliation:
EDAX, A Division of Ametek, Materials Analysis Division, Mahwah NJUSA
René de Kloe
Affiliation:
EDAX B.V., Tilburg TheNetherlands
Stuart I. Wright
Affiliation:
EDAX, A Division of Ametek, Materials Analysis Division, Draper UTUSA

Abstract

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Type
Abstract
Information
Microscopy and Microanalysis , Volume 23 , Supplement S1: Proceedings of Microscopy & Microanalysis 2017 , July 2017 , pp. 2166 - 2167
Copyright
© Microscopy Society of America 2017 

References

[1] Prior, D.J., Mariani, E. & Wheeler, J. in Electron Backscatter Diffraction in Materials Science, 2nd Edition, ed. A. J. Schwartz, M. Kumar, B.L. Adams & D.P. FieldSpringer New Yorkp. 345.Google Scholar
[2] Morisset, C.E., et. al, Precambrian Research 174 2009). p. 95.Google Scholar
[3] Nowell, M.M. & Wright, S.I. Journal of Microscopy 213 2004). p. 296.Google Scholar
[4] Drouin, D., et al, SCANNING 29 2007). p. 92.Google Scholar
[5] DTSA2: http://www.cstl.nist.gov/div837/837.02/epq/dtsa2/.Google Scholar