Hostname: page-component-848d4c4894-5nwft Total loading time: 0 Render date: 2024-06-12T06:30:37.853Z Has data issue: false hasContentIssue false

New Tools for the Study of Deformed and Heat-Treated Materials via Electron Backscatter Diffraction

Published online by Cambridge University Press:  27 August 2014

Travis M. Rampton
Affiliation:
EDAX, A Division of Ametek, Materials Analysis Division, Mahwah, NJUSA
Matthew M. Nowell
Affiliation:
EDAX, A Division of Ametek, Materials Analysis Division, Draper, UTUSA
Stuart I. Wright
Affiliation:
EDAX, A Division of Ametek, Materials Analysis Division, Draper, UTUSA

Abstract

Image of the first page of this content. For PDF version, please use the ‘Save PDF’ preceeding this image.'
Type
Abstract
Copyright
Copyright © Microscopy Society of America 2014 

References

[1] Yoda, R, Yokomaku, T, Tsuji, N Materials Characterization 61 (2010), p.913-922.Google Scholar
[2] Wright, S, Nowell, M, Field, D Microsc. Microanal. 17 (2011), p. 316-329.Google Scholar