45 results
Novel Use of EXLO for Cryo-Manipulation of FIB Specimens
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- Journal:
- Microscopy and Microanalysis / Volume 28 / Issue S1 / August 2022
- Published online by Cambridge University Press:
- 22 July 2022, p. 80
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- August 2022
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Cryo-EXLO for Cryo-TEM of FIB Specimens
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- Microscopy and Microanalysis / Volume 28 / Issue S1 / August 2022
- Published online by Cambridge University Press:
- 22 July 2022, p. 1244
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- August 2022
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Low-Z FIB Grids for Reducing Spurious Fluorescence and X-ray Overlaps
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- Microscopy Today / Volume 30 / Issue 2 / March 2022
- Published online by Cambridge University Press:
- 25 March 2022, pp. 24-29
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- March 2022
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Mechanism of FIB-Induced Phase Transformation in Austenitic Steel
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- Microscopy and Microanalysis / Volume 28 / Issue 1 / February 2022
- Published online by Cambridge University Press:
- 29 November 2021, pp. 70-82
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- February 2022
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Nanocrystalline Diamond Grids for FIB Specimen Preparation and S/TEM Analytics
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- Microscopy and Microanalysis / Volume 27 / Issue S1 / August 2021
- Published online by Cambridge University Press:
- 30 July 2021, pp. 1018-1019
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- August 2021
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Ion-induced Transformation of Metastable Phases
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- Microscopy and Microanalysis / Volume 26 / Issue S2 / August 2020
- Published online by Cambridge University Press:
- 30 July 2020, pp. 792-793
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- August 2020
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FIB Sample Preparation for In Depth EDS Analysis
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- Microscopy and Microanalysis / Volume 25 / Issue S2 / August 2019
- Published online by Cambridge University Press:
- 05 August 2019, pp. 914-915
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- August 2019
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3D-Printed Lift Outs For EXLO and INLO Practice and Training
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- Microscopy and Microanalysis / Volume 25 / Issue S2 / August 2019
- Published online by Cambridge University Press:
- 05 August 2019, pp. 912-913
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- August 2019
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Micromanipulation, FIB, STEM, EDS and EELS of UF4 Particles
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- Microscopy and Microanalysis / Volume 25 / Issue S2 / August 2019
- Published online by Cambridge University Press:
- 05 August 2019, pp. 1584-1585
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- August 2019
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Scanning Electron Microscopy and X-Ray Microanalysis 4th Edition, Joseph I. Goldstein, Dale E. Newbury, Joseph R. Michael, Nicholas W.M. Ritchie, John Henry J. Scott, David C. Joy, Springer, 2018, 550 pp. ISBN:978-1-4939-6674-5.
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- Journal:
- Microscopy and Microanalysis / Volume 24 / Issue 6 / December 2018
- Published online by Cambridge University Press:
- 30 October 2018, p. 768
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- December 2018
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Vacuum-Assisted Ex situ Lift Out for Plan View FIB Specimen Preparation
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- Microscopy and Microanalysis / Volume 24 / Issue S1 / August 2018
- Published online by Cambridge University Press:
- 01 August 2018, pp. 832-833
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- August 2018
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Optimizing Van der Waals Forces For FIB ex situ Lift Out
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- Microscopy and Microanalysis / Volume 23 / Issue S1 / July 2017
- Published online by Cambridge University Press:
- 04 August 2017, pp. 306-307
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- July 2017
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Simultaneous Structural and Electrical Analysis of Vanadium Dioxide Using In Situ TEM
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- Microscopy and Microanalysis / Volume 23 / Issue S1 / July 2017
- Published online by Cambridge University Press:
- 04 August 2017, pp. 1672-1673
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- July 2017
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Site Specific Preparation of Powders for High-Resolution Analytical Electron Microscopy Using a Ga+ Focused Ion Beam
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- Journal:
- Microscopy and Microanalysis / Volume 22 / Issue S3 / July 2016
- Published online by Cambridge University Press:
- 25 July 2016, pp. 180-181
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- July 2016
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Manipulation of Ceramic Fibers to EXpressLO™ Grids for FIB/TEM Analysis
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- Microscopy and Microanalysis / Volume 22 / Issue S3 / July 2016
- Published online by Cambridge University Press:
- 25 July 2016, pp. 134-135
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- July 2016
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Site-Specific Manipulation of CNTs to EXpressLO™ Grids for TEM Analysis
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- Microscopy and Microanalysis / Volume 22 / Issue S3 / July 2016
- Published online by Cambridge University Press:
- 25 July 2016, pp. 1744-1745
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- July 2016
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Vacuum Assisted ex situ Lift Out of FIB Prepared Specimens
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- Microscopy and Microanalysis / Volume 21 / Issue S3 / August 2015
- Published online by Cambridge University Press:
- 23 September 2015, pp. 1407-1408
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- August 2015
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Theory and New Applications of Ex Situ Lift Out
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- Microscopy and Microanalysis / Volume 21 / Issue 4 / August 2015
- Published online by Cambridge University Press:
- 16 July 2015, pp. 1034-1048
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- August 2015
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Discussion of Electron Induced Atomic Number Contrast
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- Microscopy and Microanalysis / Volume 20 / Issue S3 / August 2014
- Published online by Cambridge University Press:
- 27 August 2014, pp. 22-23
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- August 2014
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Ex situ Lift Out of PFIB Prepared TEM Specimens
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- Journal:
- Microscopy and Microanalysis / Volume 20 / Issue S3 / August 2014
- Published online by Cambridge University Press:
- 27 August 2014, pp. 340-341
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- August 2014
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