8 results
Studies of electron energy loss near edge structure at the interface between Si and amorphous carbon films deposited by direct carbon ion beams
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- Journal:
- Journal of Materials Research / Volume 14 / Issue 8 / August 1999
- Published online by Cambridge University Press:
- 31 January 2011, pp. 3221-3225
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- August 1999
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Profiling Pvp/Ps Homopolymer Interfaces Using Core-Loss Electron Energy-Loss Spectroscopy
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- Journal:
- Microscopy and Microanalysis / Volume 4 / Issue S2 / July 1998
- Published online by Cambridge University Press:
- 02 July 2020, pp. 810-811
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- July 1998
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Effects of Fast Secondary Electrons on Spatiallyresolved Low-Loss Eels of Polystyrene
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- Microscopy and Microanalysis / Volume 4 / Issue S2 / July 1998
- Published online by Cambridge University Press:
- 02 July 2020, pp. 804-805
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- July 1998
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Energy-Loss Measurements of Polymer Microstructure and Polymer Interfaces: Issues and Opportunities
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- Microscopy and Microanalysis / Volume 3 / Issue 6 / November 1997
- Published online by Cambridge University Press:
- 31 January 2003, pp. 530-539
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- November 1997
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Segregation at Adherend Interphases in Fiber-Reinforced Epoxies
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- Microscopy and Microanalysis / Volume 3 / Issue S2 / August 1997
- Published online by Cambridge University Press:
- 02 July 2020, pp. 543-544
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- August 1997
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Electron Energy-Loss Spectrum Profiling of Polymer-Polymer Interfaces
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- Journal:
- Microscopy and Microanalysis / Volume 3 / Issue S2 / August 1997
- Published online by Cambridge University Press:
- 02 July 2020, pp. 951-952
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- August 1997
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Measuring Polymer Microstructure using Spatially-Resolved Eels in the Stem
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- Journal:
- MRS Online Proceedings Library Archive / Volume 461 / 1996
- Published online by Cambridge University Press:
- 10 February 2011, 199
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- 1996
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Time-Resolved Optical Studies of Amorphous CoSi Thin-Film Crystallization
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- Journal:
- MRS Online Proceedings Library Archive / Volume 280 / 1992
- Published online by Cambridge University Press:
- 25 February 2011, 715
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- 1992
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