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Measuring Polymer Microstructure using Spatially-Resolved Eels in the Stem

Published online by Cambridge University Press:  10 February 2011

K. Siangchaew ,
D. Arayasantiparb  and
M. Libera
K. Siangchaew
Affiliation:
Department of Materials Science and Engineering, Stevens Institute of Technology, Hoboken, N.J. 07030
D. Arayasantiparb
Affiliation:
Department of Materials Science and Engineering, Stevens Institute of Technology, Hoboken, N.J. 07030
M. Libera
Affiliation:
Department of Materials Science and Engineering, Stevens Institute of Technology, Hoboken, N.J. 07030
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Abstract

Image contrast for the examination of multiphase polymers in the transmission electron microscope (TEM) usually requires differential staining by a heavy element (Os, Ru, U). Staining methods have provided a wealth of microstructural information in polymers, but there are situations, particularly where high resolution is needed, where staining is undesirable or impossible. This research has collected microstructural information from multiphase polymers without heavy-element stains using spatially-resolved electron energy-loss spectroscopy (EELS) in a scanning transmission electron microscope (STEM). The technique is known as spectrum imaging. The principal problems facing spectrum imaging in polymer applications are: (1) the identification of spectral fingerprints distinguishing different polymer phases; and (2) the extraction of meaningful microstructural data from large data sets where the signal is weak due to instrumentation and materials constraints. This paper describes applications of spectrum imaging to PE/PS and HDPE/Nylon 6 blends. The aim is to identify adequate spectral features and establish data acquisition and extraction procedures for applications to general, unstained, multiphase polymers.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 461: Symposia BB – Morphological Control in Multiphase Polymer Mix… , 1996 , 199
Copyright
Copyright © Materials Research Society 1997

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References

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