26 results
Automated Sample Preparation of Low-k Dielectrics for FESEM
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- Journal:
- Microscopy and Microanalysis / Volume 11 / Issue S02 / August 2005
- Published online by Cambridge University Press:
- 01 August 2005, pp. 2108-2109
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- August 2005
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An Ultra-High-Tilt Two-Contact Electrical Biasing Specimen Holder for Electron Holography and Electron Tomography of Semiconductor Devices
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- Microscopy and Microanalysis / Volume 10 / Issue S02 / August 2004
- Published online by Cambridge University Press:
- 01 August 2004, pp. 1012-1013
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- August 2004
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In-Plane Magnetic Field Lorentz Stage for Use in a TEM/STEM
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- Microscopy and Microanalysis / Volume 10 / Issue S02 / August 2004
- Published online by Cambridge University Press:
- 01 August 2004, pp. 522-523
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- August 2004
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Aberration correction: Some Advantages and Alternatives
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- Microscopy and Microanalysis / Volume 10 / Issue S03 / August 2004
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- 01 August 2004, pp. 22-23
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- August 2004
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Epitaxial growth of skutterudite (CoSb3) thin films on (001) InSb by pulsed laser deposition
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- Journal of Materials Research / Volume 16 / Issue 9 / September 2001
- Published online by Cambridge University Press:
- 31 January 2011, pp. 2467-2470
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- September 2001
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HRTEM Image Simulations of Structural Defects in Gate Oxides
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- Microscopy and Microanalysis / Volume 6 / Issue S2 / August 2000
- Published online by Cambridge University Press:
- 02 July 2020, pp. 1078-1079
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- August 2000
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Effects of Ion Species and Energy on the Amorphization of Si During FIB TEM Sample Preparation as Determined by Computational and Experimental Methods
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- Microscopy and Microanalysis / Volume 6 / Issue S2 / August 2000
- Published online by Cambridge University Press:
- 02 July 2020, pp. 526-527
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- August 2000
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HRTEM Image Simulations for Gate Oxide Metrology
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- Microscopy and Microanalysis / Volume 6 / Issue S2 / August 2000
- Published online by Cambridge University Press:
- 02 July 2020, pp. 1080-1081
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- August 2000
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Physical Properties Of Single-Phase Skutterudite Thin-Films (CoSb3 and IrSb3)
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- MRS Online Proceedings Library Archive / Volume 545 / 1998
- Published online by Cambridge University Press:
- 10 February 2011, 327
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- 1998
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Anisotropic Thermal Conductivity of A Si/Ge Superlattice
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- MRS Online Proceedings Library Archive / Volume 545 / 1998
- Published online by Cambridge University Press:
- 10 February 2011, 473
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- 1998
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Preparation and Properties of Porous Bismuth Films
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- Journal:
- MRS Online Proceedings Library Archive / Volume 545 / 1998
- Published online by Cambridge University Press:
- 10 February 2011, 273
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- 1998
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Formation of Silicon on Insulator (Soi) With Separation by Plasma Implantation of Oxygen (Spimox)
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- MRS Online Proceedings Library Archive / Volume 354 / 1994
- Published online by Cambridge University Press:
- 21 February 2011, 117
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- 1994
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Thin Film Ag/YBCO Multistructures for Metal Contact Applications
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- MRS Online Proceedings Library Archive / Volume 275 / 1992
- Published online by Cambridge University Press:
- 26 February 2011, 825
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- 1992
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SOI Interface Structures in Selective Epitaxial Growth
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- MRS Online Proceedings Library Archive / Volume 238 / 1991
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- 25 February 2011, 707
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- 1991
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Surface, interface, and thin-film magnetism
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- Journal of Materials Research / Volume 5 / Issue 6 / June 1990
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- 31 January 2011, pp. 1299-1340
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- June 1990
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Microtomy of Large Particle Zeolites for Tem
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- MRS Online Proceedings Library Archive / Volume 199 / 1990
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- 16 February 2011, 153
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- 1990
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The Berkeley Atomic Resolution Microscope – an Update
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- Journal:
- MRS Online Proceedings Library Archive / Volume 139 / 1989
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- 21 February 2011, 277
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- 1989
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Investigation of the Interface Integrity of the Thermally Stable Wn/GaAs Schottky Contacts
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- MRS Online Proceedings Library Archive / Volume 148 / 1989
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- 25 February 2011, 41
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- 1989
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Ni, Pd, and Pt on GaAs: A comparative study of interfacial structures, compositions, and reacted film morphologies
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- Journal of Materials Research / Volume 2 / Issue 2 / April 1987
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- 31 January 2011, pp. 262-275
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- April 1987
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Amorphization of Silicon by Boron Ion Implantation
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- MRS Online Proceedings Library Archive / Volume 71 / 1986
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- 28 February 2011, 203
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- 1986
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