16 results
A 120 kV Transmission Electron Microscope Series for Both Life Science and Material Science Fields
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- Journal:
- Microscopy and Microanalysis / Volume 24 / Issue S1 / August 2018
- Published online by Cambridge University Press:
- 01 August 2018, pp. 1156-1157
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- August 2018
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Development of Multiple New 120 kV Transmission Electron Microscope Configurations Applicable for a Wide Range of Fields
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- Microscopy and Microanalysis / Volume 23 / Issue S1 / July 2017
- Published online by Cambridge University Press:
- 04 August 2017, pp. 62-63
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- July 2017
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120 kV TEM Equipped with an Ultra High Resolution Lens and its Application
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- Microscopy and Microanalysis / Volume 22 / Issue S3 / July 2016
- Published online by Cambridge University Press:
- 25 July 2016, pp. 48-49
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- July 2016
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In-situ SEM/TEM observation of platinum catalysts on carbon support in a gaseous atmosphere using a 300 kV CFE TEM/SEM
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- Microscopy and Microanalysis / Volume 19 / Issue S2 / August 2013
- Published online by Cambridge University Press:
- 09 October 2013, pp. 464-465
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- August 2013
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EELS Analyses of Gaseous Atmosphere and Heated Specimen in an ETEM
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- Microscopy and Microanalysis / Volume 19 / Issue S2 / August 2013
- Published online by Cambridge University Press:
- 09 October 2013, pp. 506-507
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- August 2013
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Development of an in-situ High Temperature-High Humidity TEM Observation Technique and Its Application to the Analysis of Catalyst Degradation Mechanism
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- Microscopy and Microanalysis / Volume 18 / Issue S2 / July 2012
- Published online by Cambridge University Press:
- 23 November 2012, pp. 1162-1163
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- July 2012
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3D Elemental Mapping Using a Dedicated STEM Equipped with a Real-Time EELS Imaging System
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- Microscopy and Microanalysis / Volume 14 / Issue S2 / August 2008
- Published online by Cambridge University Press:
- 03 August 2008, pp. 1404-1405
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- August 2008
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A Method for Site-specific Specimen Preparation of Si Device after 65 nm-node Technology using FIB-STEM/TEM System
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- Microscopy and Microanalysis / Volume 13 / Issue S02 / August 2007
- Published online by Cambridge University Press:
- 05 August 2007, pp. 790-791
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- August 2007
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Atomic Scale Imaging and High Sensitive Elemental Analysis with an Aberration Corrected Dedicated STEM
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- Microscopy and Microanalysis / Volume 13 / Issue S02 / August 2007
- Published online by Cambridge University Press:
- 05 August 2007, pp. 886-887
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- August 2007
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Environmental Transmission Electron Microscopy Using a Conventional TEM and a Gas Injection-Specimen Heating Holder
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- Microscopy and Microanalysis / Volume 12 / Issue S02 / August 2006
- Published online by Cambridge University Press:
- 31 July 2006, pp. 766-767
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- August 2006
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Recent Developments in Failure Analysis in an Ultra thin Film Evaluation System
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- Microscopy and Microanalysis / Volume 6 / Issue S2 / August 2000
- Published online by Cambridge University Press:
- 02 July 2020, pp. 136-137
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- August 2000
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A Method for Site Specific Characterization Using a Dedicated FIB System Combined With an Analyitical TEM
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- Microscopy and Microanalysis / Volume 5 / Issue S2 / August 1999
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- 02 July 2020, pp. 914-915
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- August 1999
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A New Method for Pin Point Failure Analysis Using Fib Combined Analytical Tem
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- Microscopy and Microanalysis / Volume 4 / Issue S2 / July 1998
- Published online by Cambridge University Press:
- 02 July 2020, pp. 654-655
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- July 1998
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Kinetics of Ge Segregation in the Presence of Sb During Molecular Beam Epitaxy
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- MRS Online Proceedings Library Archive / Volume 220 / 1991
- Published online by Cambridge University Press:
- 22 February 2011, 217
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- 1991
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Initial Oxidation of MBE-Grown Si Surfaces
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- MRS Online Proceedings Library Archive / Volume 220 / 1991
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- 22 February 2011, 35
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- 1991
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Suppression of Interfacial Mixing by Sb Deposition in Si/Ge Strained-Layer Superlattices
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- MRS Online Proceedings Library Archive / Volume 220 / 1991
- Published online by Cambridge University Press:
- 22 February 2011, 193
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- 1991
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