12 results
S41 Application of X-ray Diffraction Stress Analysis at Constant Penetration Depth for the Determination of Both Real-Space Residual-Stress and Lattice-Parameter Gradients
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- Journal:
- Powder Diffraction / Volume 23 / Issue 2 / June 2008
- Published online by Cambridge University Press:
- 20 May 2016, p. 182
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S22 Invited—Diffraction Analysis of Stress Gradients in Tin Thin Films: An Explanation for the Occurrence of Whisker Formation?
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- Journal:
- Powder Diffraction / Volume 23 / Issue 2 / June 2008
- Published online by Cambridge University Press:
- 20 May 2016, p. 185
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Powder diffraction data for the germanides CoGe and Co5Ge7
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- Journal:
- Powder Diffraction / Volume 15 / Issue 2 / June 2000
- Published online by Cambridge University Press:
- 10 January 2013, pp. 120-122
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Powder diffraction data for borides Pd3B and Pd5B2 and the formation of an amorphous boride Pd2B
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- Powder Diffraction / Volume 16 / Issue 2 / June 2001
- Published online by Cambridge University Press:
- 05 March 2012, pp. 98-101
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Hardness–depth profile of a carbon-implanted Ti–6Al–4V alloy and its relation to composition and microstructure
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- Journal:
- Journal of Materials Research / Volume 16 / Issue 8 / August 2001
- Published online by Cambridge University Press:
- 31 January 2011, pp. 2321-2335
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- August 2001
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Sub-Micrometer Spatially Resolved Measurements of Mechanical Properties and Correlation to Microstructure and Composition
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- Journal:
- MRS Online Proceedings Library Archive / Volume 649 / 2000
- Published online by Cambridge University Press:
- 17 March 2011, Q3.2
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- 2000
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X-Ray Diffraction and Reflectometry Investigation of Interdiffusion In Sputtered Niobium-Tungsten Bilayers
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- Journal:
- MRS Online Proceedings Library Archive / Volume 562 / 1999
- Published online by Cambridge University Press:
- 10 February 2011, 147
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- 1999
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Nanometer-Scale Measurements of Mechanical Properties and Composition in an Ion Implanted Titanium–Based Alloy
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- Journal:
- MRS Online Proceedings Library Archive / Volume 522 / 1998
- Published online by Cambridge University Press:
- 10 February 2011, 95
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- 1998
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Diffraction analysis of nonuniform stresses in surface layers: Application to cracked TiN coatings chemically vapor deposited on Mo
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- Journal:
- Journal of Materials Research / Volume 11 / Issue 6 / June 1996
- Published online by Cambridge University Press:
- 31 January 2011, pp. 1440-1457
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- June 1996
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X-Ray Diffraction Analysis of Simultaneous Changes in Stress and Dislocation Densities in Thin Films
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- Journal:
- Advances in X-ray Analysis / Volume 39 / 1995
- Published online by Cambridge University Press:
- 06 March 2019, pp. 195-210
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- 1995
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Correlation of Stress Relaxation and Microstructure Change in Polycrystalline Thin Films on Substrates: Au on Si <100> at RT
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- Journal:
- MRS Online Proceedings Library Archive / Volume 230 / 1991
- Published online by Cambridge University Press:
- 26 July 2012, 103
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- 1991
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Boriding of Fe and Fe–C, Fe–Cr, and Fe–Ni alloys; Boride-layer growth kinetics
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- Journal:
- Journal of Materials Research / Volume 4 / Issue 6 / December 1989
- Published online by Cambridge University Press:
- 31 January 2011, pp. 1354-1370
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- December 1989
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