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Microstructural Characterization of Longitudinal Magnetic Recording Media
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- 10 February 2011, 3
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Electron Holography of Nanostructured Magnetic Materials
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- 10 February 2011, 13
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Flux Mapping and Magnetic Behavior of Grain Boundaries in Nd-Fe-B Magnets
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- 10 February 2011, 19
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LEEM Investigations of bcc Metals Grown Heteroepitaxially on Sapphire
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- 10 February 2011, 27
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Electron Backscatter Diffraction: A Powerful Tool for Phase Identification in the SEM
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- 10 February 2011, 39
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Measuring the Thin Film Strain Tensor Near Aluminum Grain Boundaries via a New Image Processing Approach to CBED HOLZ Patterns
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- 10 February 2011, 51
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Controlled Environment Transmission Electron Microscopy
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- 10 February 2011, 57
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Analysis of the Atomic Scale Defect Chemistry in Oxygen Deficient Materials by STEM
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- 10 February 2011, 69
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Energy Dispersive X-ray Spectrometry With the Transition Edge Sensor Microcalorimeter: A Revolutionary Advance in Materials Microanalysis
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- 10 February 2011, 75
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Surface Sensitivity Effects With Local Probe Scanning Auger-Scanning Electron Microscopy
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- 10 February 2011, 81
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X-ray Elemental Mapping of Multi-Component Steels
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- 10 February 2011, 87
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High Sensitivity Convergent Beam Electron Diffraction for the Determination of the Tetragonal Distortion of Epitaxial Films
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- 10 February 2011, 93
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Determination of Coherency Strain Fields Around Coherent Particles in Ni-Al Alloys by HREM and CBED
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- 10 February 2011, 99
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An Electron Microscope Study of Diffusion Assisted Dislocation Processes in Intermetallic Gamma TiAl
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- 10 February 2011, 105
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Specimen Current Imaging of Delamination in Ceramic Films on Metal Substrates in the SEM
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- 10 February 2011, 111
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In Situ Observation of Melting and Solidification
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- 10 February 2011, 117
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Site Occupancy Determination by ALCHEMI of Nb and Cr in γ-TiAl and Their Effects on the a to γ Massive Phase Transformation
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- 10 February 2011, 123
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Electron Channeling X-ray Microanalysis for Cation Configuration in Irradiated Magnesium Aluminate Spinel
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- 10 February 2011, 129
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In Situ Study of Zirconia Stabilization by Anion Exchange (N for O) Using High-Temperature, Controlled Atmosphere Electron Diffraction
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- 10 February 2011, 135
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Environmental Scanning Electron Microscopy as a Tool to Study Shrinkage Microcracks in Cement-Based Materials
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- 10 February 2011, 141
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