Analytical Sciences Symposia
Advances in Focused Ion Beam Instrumentation, Applications and Techniques in Materials and Life Sciences
Plasma FIB Applications in Life Science: From Large Volumes to Cryo-lamella Preparation
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- 22 July 2022, pp. 24-25
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Software and Instrumentation
The Mechanistic Determination of Doping Contrast from Fermi Level Pinned Surfaces in the Scanning Electron Microscope Using Energy-Filtered Imaging and Calculated Potential Distributions
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- 22 September 2022, pp. 1538-1549
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Strategies for EELS Data Analysis. Introducing UMAP and HDBSCAN for Dimensionality Reduction and Clustering
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- 22 November 2021, pp. 109-122
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Electron Probe Microanalysis of Transition Metals using L lines: The Effect of Self-absorption
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- 25 November 2021, pp. 123-137
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Analytical Sciences Symposia
Advances in Focused Ion Beam Instrumentation, Applications and Techniques in Materials and Life Sciences
Possible Approaches for Combined Use of Xenon and Gallium Ion Sources for Task Specific Focused Ion Beam Sample Preparation
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- 22 July 2022, pp. 26-27
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Development and Computation
Best Practices for Analysis of Carbon Fibers by Atom Probe Tomography
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- 06 October 2021, pp. 1092-1101
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Software and Instrumentation
Sub-pixel Tomographic Methods for Characterizing the Solid Architecture of Foams
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- 18 March 2022, pp. 689-700
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Precise Drift Tracking for In Situ Transmission Electron Microscopy via a Thon-Ring Based Sample Position Measurement
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- 23 May 2022, pp. 1945-1951
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A Method for High-Resolution Three-Dimensional Reconstruction with Ewald Sphere Curvature Correction from Transmission Electron Images
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- 29 April 2022, pp. 1550-1566
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Aberration Correction to Optimize the Performance of Two-Photon Fluorescence Microscopy Using the Genetic Algorithm
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- 25 January 2022, pp. 383-389
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Contrast Mechanisms in Secondary Electron e-Beam-Induced Current (SEEBIC) Imaging
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- 30 May 2022, pp. 1567-1583
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Fast Improvement of TEM Images with Low-Dose Electrons by Deep Learning
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- 10 December 2021, pp. 138-144
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Towards Augmented Microscopy with Reinforcement Learning-Enhanced Workflows
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- 05 September 2022, pp. 1952-1960
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Analytical Sciences Symposia
Advances in Focused Ion Beam Instrumentation, Applications and Techniques in Materials and Life Sciences
Using the Helium Ion Microscope for Imaging and Modification of Nanostructures, 2D Materials, and SARS-CoV-2 Infected Cells
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- 22 July 2022, p. 28
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Development and Computation
A Bottom-Up Volume Reconstruction Method for Atom Probe Tomography
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- 28 January 2022, pp. 1102-1115
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Software and Instrumentation
Automated Crystal Orientation Mapping in py4DSTEM using Sparse Correlation Matching
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- 09 February 2022, pp. 390-403
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Quantitative Strain and Topography Mapping of 2D Materials Using Nanobeam Electron Diffraction
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- 01 April 2022, pp. 701-715
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Development and Computation
Reflections on the Spatial Performance of Atom Probe Tomography in the Analysis of Atomic Neighborhoods
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- 20 October 2021, pp. 1116-1126
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Software and Instrumentation
Warp-Free TEM Sample Preparation Methods Using FIB/SEM Systems
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- 09 September 2022, pp. 1961-1970
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O-Net: A Fast and Precise Deep-Learning Architecture for Computational Super-Resolved Phase-Modulated Optical Microscopy
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- 15 June 2022, pp. 1584-1598
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