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Microscopy and Microanalysis

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Microscopy and Microanalysis
ISSN: 1431-9276

EISSN: 1435-8115

URL: /core/journals/microscopy-and-microanalysis
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Microscopy and Microanalysis

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Volume 26 - December 2020

Approaching Operando Imaging of Functional Materials

Microstructural Characterization on AISI 4140 Steel Boriding by New and Reused Dehydrated Boron Paste

In Situ Microscopy Study of ZnO Acid Etching Nanostructures

Advances in Modeling, Simulation, and Artificial Intelligence in Microscopy and Microanalysis for Physical and Biological Systems

Forget About Cleaning up Your Micrographs: Deep Learning Segmentation is Robust to Image Artifacts

Component Detection and Evaluation Framework (CDEF): A Semantic Annotation Tool

Architecture Optimization and Interpretability in Neural Networks for HRTEM Segmentation

Making Image Analysis Easier with Machine Learning: A Foam Cell Size Study

Four-dimensional Scanning Transmission Electron Microscopy (4D-STEM): New Experiments and Data Analyses for Determining Materials Functionality and Biological Structures

Dose-Efficient Cryo-STEM Imaging of Vitrified Biological Samples

Assessing the Structure-property Relationship in Enamel at the Nanoscale Using 4D-STEM

Low Dose Electron Ptychography for Cryo-biological Imaging

Applications of Momentum-resolved Scanning Transmission Electron Microscopy for Cryo-preserved Radiation Sensitive Materials

Impact of Recent Advancement in Instrumentation/Detectors on Electron Energy Loss Spectroscopy for Physical and Biological Sciences

Exploring Phononic and Photonic Excitations with Monochromated STEM EELS

Strong Phonon-Plasmon Coupling Between Nanoscale Antennas

Combining Highly Monochromatized EELS with CL for Probing Elementary Excitations and Their Interaction

Pushing the Limits of Detection in Quantitative (S)TEM Imaging, EELS, and EDX

Temperature Dependence of Impurity Distributions in Nanodiamonds as Revealed by Coordinated UHV-STEM EDX and EELS Analysis

Sub-Ångstrom EDX Mapping Enabled by a High-brightness Cold Field Emission Source

Evaluation of Confocal X-ray Analysis for Single-Atom Detection in a Thin Specimen by an Advanced Analytical Electron Microscope

Accessing Atomic-scale Phosphorus Dopant Distribution in Precise Silicon Devices by Advanced STEM Imaging and Spectroscopy

Sensitivity and Figure of Merit Measurements of EELS vs XEDS in the Analytical Electron Microscope

Crystallography at the Nanoscale and MicroED with Electrons and X-rays

Structural Characterization of Beam Sensitive Pharmaceutical Compounds Using 3D Electron Diffraction-Micro-ED at Low Dose with Pixelated Detectors

Sub-Ångström-resolution MicroED Using a Direct Detection Camera

Microscopy and Microanalysis

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Volume 26 - December 2020

Approaching Operando Imaging of Functional Materials

Advances in Modeling, Simulation, and Artificial Intelligence in Microscopy and Microanalysis for Physical and Biological Systems

Four-dimensional Scanning Transmission Electron Microscopy (4D-STEM): New Experiments and Data Analyses for Determining Materials Functionality and Biological Structures

Impact of Recent Advancement in Instrumentation/Detectors on Electron Energy Loss Spectroscopy for Physical and Biological Sciences

Pushing the Limits of Detection in Quantitative (S)TEM Imaging, EELS, and EDX

Crystallography at the Nanoscale and MicroED with Electrons and X-rays