Microscopy and Microanalysis: Volume 26 -

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Microscopy and Microanalysis
ISSN: 1431-9276

EISSN: 1435-8115

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Microscopy and Microanalysis

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Volume 26 - December 2020

Advances in Electron Microscopy to Characterize Materials Embedded in Devices

An Approach to Extend Electron Holography into Characterization on Dopant Profiles for FinFET of Nanometer Semiconductor Device in Wafer-foundries

Characterization of Failure Surfaces of Epoxy Adhesive Under Various Fatigue Loading Conditions

Direct Observation of Phase Transformations in Ge-Sb-Te Materials

Cryo-TEM Study of Interfaces in Rechargeable Lithium Batteries

Charge Transfer Effects in CuO Nanofibers, Observed by EELS and XPS.

In Situ TEM at the Extremes

In Situ TEM Investigation on the Thermal Stability of Hydroxyapatite Nanobelts

In Situ TEM Visualization on the Super Flexibility of Multi-layered Hydroxyapatite Nanobelts with Antibacterial Property

Kinetically Favorable Growth of Oxides Nanowires and Pyramids with Gold Seeds

Formation Mechanism of the Dominant Kinks in GaP Nanowires Grown in an In-situ (S)TEM Gas Cell Holder

In Situ TEM Observation of Epitaxy-induced NaCl Phase Transformation on the Au Nanowire Substrate

A New Pathway for the Formation of Co-aligned Hierarchical Mesocrystals

Introduction of Advanced Electron Microscopy In-situ Techniques in CAMMA

Structural Transformation and Morphology of Dipeptide Supramolecular Assemblies by Liquid-phase TEM

In Situ Observation of Electrochemical Reduction of CO2 Using Cuprous and Intermetallic Catalysts

Investigation of Solid-state Chemical Lithiation of Single Crystalline Silicon Thin Window Anodes by Analytical Scanning and Transmission Electron Microscopy

Applications of Graphene Liquid Cell

Approaching Operando Imaging of Functional Materials

Ex-situ TEM: Insights into Metal Particle Growth During Fischer-Tropsch Synthesis

Monitoring the Conductivity of Thin Metal Layers During the Processes of Grain-growth and Dewetting, Using a Desktop FEG-SEM

Realistic Bulk Electrochemistry in Liquid Cell Microscopy

Using Operando Electrochemical TEM as Part of a Correlative Approach to Characterize Failure Modes in Solid-state Energy Storage Devices

Microscopy and Microanalysis

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Volume 26 - December 2020

Advances in Electron Microscopy to Characterize Materials Embedded in Devices

In Situ TEM at the Extremes

Approaching Operando Imaging of Functional Materials