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Introduction of Advanced Electron Microscopy In-situ Techniques in CAMMA
Published online by Cambridge University Press: 30 July 2020
Abstract
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- Type
- In Situ TEM at the Extremes
- Information
- Copyright
- Copyright © Microscopy Society of America 2020
References
FIB Preparation of Samples for MEMS-based TEM Heating Experiments; By Vijayan, S, Jinschek, JR, Kujawa, S, Greiser, J and Aindow, M. Microsc Microanal. 23: 708–716 (2017).10.1017/S1431927617000605CrossRefGoogle Scholar