Microscopy and Microanalysis: Volume 24 -

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Microscopy and Microanalysis
ISSN: 1431-9276

EISSN: 1435-8115

URL: /core/journals/microscopy-and-microanalysis
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Microscopy and Microanalysis

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Volume 24 - August 2018

Physical Science Symposia

Modulating Electron Beams in Space and Time to Probe for Structure and Function of Soft and Hard Matter

Abstract

Elucidating Mechanisms for Electron Beam Damage in Conjugated Polymers

Local Structural Analysis of Graphitic Carbon Nitrides

Electronic and Structural Characterization of Diamondoid Carbon Nanothreads by Transmission Electron Microscopy

Graphene Defect Editing, Deposition, and Growth via E-Beam-Induced Organic Reactions in Aberration Corrected STEM

Study of the Crystalline and Mesoporous Structure of a Heterogeneous Catalyst (ZSM-5) in Relation to Al, Si and Other Heteroatom, Distribution by Transmission Electron Microscopy

Validation of Minimum Electron Beam Dosage on Characterization of Carbon-Depletion in ULK Dielectric Materials by EELS Quantifications

Observing the Chemical Transformation of MnBn Catalyzed by Cu under Electron Beam Irradiation

The Effect of a Pulsed Electron Beam on Damage Threshold

Morphological Characterization of Tri-Continuous Conductive PP/PMMA/EAA Carbon Black Composites

Ultrafast Transmission Electron Microscopy with High-Coherence Electron Pulses

TEM Characterization of Ball Milled Synthesized CIGS, CIS and CGS Nanoparticles for Energy Applications

Applications of Integrated Electron Probe Microscopy and Microanalysis Techniques in Characterizing Earth Materials

Abstract

A Combined Cathodoluminescence and Wavelength Dispersive Spectrometry Study of Ti Zoning in Quartz from the Tuolumne Intrusive Suite in Yosemite, CA

Confocal Raman-in-SEM Imaging: a New Method for 3D Morphology of Asbestos like Fibers in a Mineral Matrix - Complementarity with SEM-FIB.

Stone-Cold Low Temperature Cathodoluminescence Spectrometry of Quartz (SiO2)

Iron La and LP X-ray Lines: a Comparison of EPMA Measurements and Theoretical Calculations, With Possible Implications for Oxidation Determination

Material Discrimination at High Spatial Resolution using Sub-300eV X-rays

Crystallographic Orientation Information by Soft X-Ray Spectroscopy

Analysis of Redox Changes in Silicate Glasses Using EPMA and Raman Spectroscopy

Investigation of Nitrogen in Silicate Glasses and Iron Alloys by SXES

You Do What in Your Microprobe?! The EPMA as a Multimode Platform for Nitride Semiconductor Characterization

Microscopy and Microanalysis

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Volume 24 - August 2018

Physical Science Symposia

Modulating Electron Beams in Space and Time to Probe for Structure and Function of Soft and Hard Matter

Abstract

Applications of Integrated Electron Probe Microscopy and Microanalysis Techniques in Characterizing Earth Materials

Abstract