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Material Discrimination at High Spatial Resolution using Sub-300eV X-rays

Published online by Cambridge University Press:  01 August 2018

P. Statham ,
J. Sagar ,
S. Burgess  and
J. Holland
P. Statham
Affiliation:
Oxford Instruments NanoAnalysis, High Wycombe, Bucks, U.K.
J. Sagar
Affiliation:
Oxford Instruments NanoAnalysis, High Wycombe, Bucks, U.K.
S. Burgess
Affiliation:
Oxford Instruments NanoAnalysis, High Wycombe, Bucks, U.K.
J. Holland
Affiliation:
Oxford Instruments NanoAnalysis, High Wycombe, Bucks, U.K.

Abstract

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Abstract
Information
Microscopy and Microanalysis , Volume 24 , Supplement S1: Proceedings of Microscopy & Microanalysis 2018 , August 2018 , pp. 2018 - 2019
Copyright
© Microscopy Society of America 2018 

References

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