Physical Sciences
ArcheoMetallurgy: Analyses & Characterization
Abstract
SEM Characterization of the Microstructure of Ancient Pueblo Pottery
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- 26 July 2009, pp. 1504-1505
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Analysis and Characterization of Embrittlement in Archaeological Silver and Iron
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- 26 July 2009, pp. 1508-1509
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Pottery Making Begins in the New World: First Results from Barbados
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- 26 July 2009, pp. 1510-1511
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SEM of Ancient Jewelry
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- 26 July 2009, pp. 1512-1513
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Microstructural Characterization of Reheated Iron Meteorites by Electron Microscopy Techniques
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- 26 July 2009, pp. 1514-1515
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Metallographic Examination of Bronze Bracelets from Hasanlu
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- 26 July 2009, pp. 1516-1517
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An Analysis of Prehistoric Pottery Paint Composition Utilizing Energy Dispersive Spectroscopy
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- 26 July 2009, pp. 1518-1519
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Tech Forum
Technologist Forum Platform Session: Image Analysis
Abstract
The Open Microscopy Environment: Informatics and Quantitative Analysis for Biological Microscopy
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- 26 July 2009, pp. 1520-1521
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Using the Virtual Cell Simulation Environment for Extracting Quantitative Parameters from Live Cell Fluorescence Imaging Data
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- 26 July 2009, pp. 1522-1523
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3-D TEM Reconstructions with EMAN2
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- Published online by Cambridge University Press:
- 26 July 2009, pp. 1524-1525
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Applications of Modern Stereology to Quantitative Light Microscopy
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- Published online by Cambridge University Press:
- 26 July 2009, pp. 1526-1527
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Deconvolution of Fluorescence Microscope Imagery
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- Published online by Cambridge University Press:
- 26 July 2009, pp. 1528-1529
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Technologist Forum Special Topics Session: Electron Tomography
Abstract
Low Temperature Specimen Preparation for Electron Tomography
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- 26 July 2009, pp. 1530-1531
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Plastic Section and Cryo-Electron Tomography Using the IMOD Software Package
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- 26 July 2009, pp. 1532-1533
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Electron Tomography in Materials Science
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- 26 July 2009, pp. 1534-1535
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Tutorial
Image processing and interpretation in 3D electron microscopy
Abstract
Image Processing and Interpretation in Structural Electron Microscopy
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- 26 July 2009, pp. 1536-1537
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Back to the Basics: The Fundamentals of Cryo-electron Microscopy
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Back to the basics: The fundamentals of cryo-electron microscopy
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- 26 July 2009, pp. 1538-1539
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Sample Preparation for Materials Scientists
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Sample Preparation for Materials Scientists
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- 26 July 2009, pp. 1540-1541
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Back to the Basics: The Use of Transmission Electron Microscopy - What Are the Real Capabilities and When do I Use It?
Abstract
The Use of Transmission Electron Microscopy – What are the Real Capabilities and When can I use it?
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- Published online by Cambridge University Press:
- 26 July 2009, pp. 1542-1543
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Back to the Basics: FIB Sample Preparation of Thin Films and Soft Materials
Abstract
FIB Sample Preparation of Thin Films and Soft Materials
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- 26 July 2009, pp. 1544-1545
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