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Volume 15 - April 2009

Contents

Page 45 of 47

Physical Sciences

The Otto Scherzer Memorial Symposium on Aberration-Corrected Electron Microscopy

Abstract

  • Simultaneous Z-Contrast/Phase Contrast Imaging of Ferroelectric Thin Films

  • M Chisholm, HN Lee, W Luo, ST Pantelides
  • Published online by Cambridge University Press:
    26 July 2009, pp. 1464-1465
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

  • Progress towards an Absolute-Scale Quantification of HRTEM Images

  • A Thust, J Barthel
  • Published online by Cambridge University Press:
    26 July 2009, pp. 1466-1467
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

  • The Treatment of Spatial Incoherence in the Aberration Corrected STEM

  • MP Oxley, SJ Pennycook
  • Published online by Cambridge University Press:
    26 July 2009, pp. 1468-1469
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

  • Defining HRTEM Resolution: Why Youngs Fringes Don't Measure Resolution

  • MA O'Keefe, LF Allard, DA Blom
  • Published online by Cambridge University Press:
    26 July 2009, pp. 1470-1471
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

  • Aberration Correction and Exit Wave Reconstruction Using Tilt Azimuth Data

  • AI Kirkland, S Haigh
  • Published online by Cambridge University Press:
    26 July 2009, pp. 1472-1473
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

  • Prospects for Reliable 3D Imaging in Aberration-corrected STEM, TEM and SCEM

  • HL Xin, DA Muller
  • Published online by Cambridge University Press:
    26 July 2009, pp. 1474-1475
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

  • Adatom on Graphene, Directly Imaged by Aberration Corrected TEM at 300kV

  • T Tanaka, Y Abe, H Sawada, H Okunishi, Y Kondo, Y Tanishiro, K Takayanagi
  • Published online by Cambridge University Press:
    26 July 2009, pp. 1476-1477
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

  • Real-space Measurements of Bonding Charge Density in Aberration-corrected High Resolution Electron Microscopy

  • J Ciston, SJ Haigh, JS Kim, AI Kirkland, LD Marks
  • Published online by Cambridge University Press:
    26 July 2009, pp. 1478-1479
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

  • Direct Imaging of Light Elements in Aberration-Corrected Scanning Transmission Electron Microscopy

  • JC Idrobo, MP Oxley, W Walkosz, RF Klie, S Ogut, B Mikijelj, SJ Pennycook, ST Pantelides
  • Published online by Cambridge University Press:
    26 July 2009, pp. 1480-1481
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

  • Electron Energy Loss Spectroscopy of Graphene Identified by Aberration, Corrected TEM at 300kV

  • Y Abe, T Tanaka, H Sawada, E Okunishi, Y Kondo, Y Tanishiro, K Takayanagi
  • Published online by Cambridge University Press:
    26 July 2009, pp. 1484-1485
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

  • Imaging ZnO Nanobelts and Nanobelt Supported Metal Nanocatalysts by Aberration-corrected Scanning Transmission Electron Microscopy

  • J Liu, LF Allard
  • Published online by Cambridge University Press:
    26 July 2009, pp. 1486-1487
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

  • Aberration-Correction in a Monochromated and Energy Filtered Environment,

  • DC Bell, S Meyer, A Orchowski, P Tayebati, G Benner
  • Published online by Cambridge University Press:
    26 July 2009, pp. 1490-1491
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

  • Electron Channeling Artifacts in Silicon [211] Using Aberration-Corrected STEM

  • R Hovden, HL Xin, DA Muller
  • Published online by Cambridge University Press:
    26 July 2009, pp. 1492-1493
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

  • Observation of Cluster Formation from MgO-supported Mononuclear Ir-Complexes by Aberration-Corrected STEM

  • V Ortalan, A Uzun, LF Allard, H Iddir, BC Gates, ND Browning
  • Published online by Cambridge University Press:
    26 July 2009, pp. 1494-1495
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

ArcheoMetallurgy: Analyses & Characterization

Abstract

  • Electron Basckscattering Diffraction Analysis of a Reconstructed Wootz Damascus Steel Blade

  • AP Sullivan, MR Barnett
  • Published online by Cambridge University Press:
    26 July 2009, pp. 1496-1497
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

  • Metallurgy of the Monitor

  • E Nordgren, E Secord
  • Published online by Cambridge University Press:
    26 July 2009, pp. 1498-1499
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

  • A Contribution to the Knowledge of Ancient Pre-Hispanic Au-Pt Processes

  • ME Noguez, G Villegas, G Salas, T Robert, J Ramírez
  • Published online by Cambridge University Press:
    26 July 2009, pp. 1500-1501
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

  • Nails and Rivets: Pre-Nineteenth Century

  • MA Hineman, F Schmidt
  • Published online by Cambridge University Press:
    26 July 2009, pp. 1502-1503
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

Page 45 of 47