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Volume 15 - April 2009

Contents

Page 44 of 47

Physical Sciences

Characterization of Materials for Responsible Energy Generation and Use

Abstract

  • Electron Holography of Hetero-Interfaces in Solid Oxide Fuel Cells

  • T Tanji, S Mizuno, T Kato, T Hirayama
  • Published online by Cambridge University Press:
    26 July 2009, pp. 1424-1425
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

  • Atomic Resolution Investigation of Metal-Assisted Hydrogen Storage Mechanisms in Activated Carbon Fibers

  • CS Bonifacio, AM Thron, SJ Pennycook, CI Contescu, NC Gallego, K van Benthem
  • Published online by Cambridge University Press:
    26 July 2009, pp. 1426-1427
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

  • TiO2 Nanoparticle and ZnO Nanowire Composite for Solar Cell Application

  • H Li, M Tung, J Jiao
  • Published online by Cambridge University Press:
    26 July 2009, pp. 1428-1429
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

  • Nanocrystalline Solar Cell Materials Characterization

  • OE Dyck, G Perkins, J Curnes, PE Russell, DN Leonard
  • Published online by Cambridge University Press:
    26 July 2009, pp. 1430-1431
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

  • Direct Methanol Fuel Cell Materials Characterization

  • DN Monroe, DJ Richard, AD Martin, DN Leonard, PE Russell
  • Published online by Cambridge University Press:
    26 July 2009, pp. 1432-1433
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

  • WO3 Electrochromic Film Deposited on Flexible CNT-on-PET Substrate

  • DA Castañón-Cisneros, H Esparza-Ponce, A Rosas-Aburto, W Antúnez-Flores, A Aguilar-Elguézabal, M Román-Aguirre
  • Published online by Cambridge University Press:
    26 July 2009, pp. 1434-1435
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

  • In situ EELS Study of the Thermochromic Transition in VO2

  • MT Ochoa-Lara, HE Esparza-Ponce, F Espinosa-Magaña
  • Published online by Cambridge University Press:
    26 July 2009, pp. 1436-1437
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

  • Structural Characterization of Vanadium Phosphate Catalysts Prepared using a Di-block Copolymer Template

  • W Weng, Z Lin, NF Dummer, JK Bartley, GJ Hutchings, CJ Kiely
  • Published online by Cambridge University Press:
    26 July 2009, pp. 1438-1439
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

  • Formation and Characterization of γ- Al2O3 Films Produced by Oxidation of β–NiAl(110)

  • Z Zhang, L Li, L Wang, SI Sanchez, Q Wang, DD Johnson, AI Frenkel, RG Nuzzo, JC Yang
  • Published online by Cambridge University Press:
    26 July 2009, pp. 1440-1441
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

  • Metal Nanostructures on Ceramic Surfaces for Energy Applications

  • J Basu, S Bhowmick, JP Winterstein, N Ravishankar, CB Carter
  • Published online by Cambridge University Press:
    26 July 2009, pp. 1442-1443
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

  • Electron Microscopy Analysis of Interfaces in Oxides for Energy Applications

  • JP Winterstein, C Wang, CB Carter
  • Published online by Cambridge University Press:
    26 July 2009, pp. 1444-1445
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

  • 3-D EBSD Analysis of High Temperature Sintered YSZ; Evidence of Trace Cubic Phase

  • LV Saraf, S Thevuthasan, BW Arey, LR Pederson
  • Published online by Cambridge University Press:
    26 July 2009, pp. 1446-1447
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

  • SEM of Carbon Coated LiFePO4 Through Silicon Nitride Windows in Liquid

  • JY Howe, LR Walker, JO Kiggans, NJ Dudney
  • Published online by Cambridge University Press:
    26 July 2009, pp. 1448-1449
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

  • TEM Studies of Au/Si Epilayer Interfaces

  • F Wang, SY Sayed, M Malac, D Wang, R Egerton, J Buriak
  • Published online by Cambridge University Press:
    26 July 2009, pp. 1450-1451
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

The Otto Scherzer Memorial Symposium on Aberration-Corrected Electron Microscopy

Abstract

  • In Remembrance of Otto Scherzer, the Eminent Pioneer of Electron Optics

  • H Rose
  • Published online by Cambridge University Press:
    26 July 2009, pp. 1452-1453
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

  • Zernike Phase Contrast Electron Microscopy with a Spherically Corrected Foil Lens

  • D Typke
  • Published online by Cambridge University Press:
    26 July 2009, pp. 1454-1455
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

  • First Application of Cc Corrected Imaging for High-Resolution and Energy-Filtered TEM

  • B Kabius, P Hartel, M Haider, H Müller, S Uhlemann, U Loebau, J Zach
  • Published online by Cambridge University Press:
    26 July 2009, pp. 1456-1457
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

  • Aberration Correction and Electron Holography

  • H Lichte, D Geiger, M Linck, M Lehmann
  • Published online by Cambridge University Press:
    26 July 2009, pp. 1460-1461
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

  • Aberration-Corrected STEM

  • NJ Bacon, GJ Corbin, N Dellby, P Hrncirik, O Krivanek, M Murfitt, CS Own, Z Szilagyi
  • Published online by Cambridge University Press:
    26 July 2009, pp. 1462-1463
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

Page 44 of 47