Physical Sciences
Magnetic, Semiconducting and Superconducting Materials
Abstract
Magnetic Alignment of Iron(III) Oxide Decorated CNT Polymer Composites
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- 26 July 2009, pp. 1060-1061
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Characterization of Interfacial Misfit Array Formation for GaSb Growth on GaAs by Transmission Electron Microscopy
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- 26 July 2009, pp. 1062-1063
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Nanostructural Characterization of Y1-xSmxBa1.5Cu3Oy Coated Conductors with BaZrO3 Particles by Transmission Electron Microscopy
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- 26 July 2009, pp. 1064-1065
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Metals and Alloys
Abstract
Early Stage Strong Metal Support Interaction (SMSI) Effects in an Experimental Titania-Supported Platinum Catalyst An Environmental TEM Study
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- 26 July 2009, pp. 1066-1067
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Influence of Environment on Wear of Al-Si Alloys
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- 26 July 2009, pp. 1068-1069
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The Influence of Stacking Fault Energy on the Temperature Dependent Deformation Mechanisms in High Mn-N Austenitic Stainless Steel
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- 26 July 2009, pp. 1070-1071
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Characterization of Continuous Cast AA2037 Al Alloy
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- 26 July 2009, pp. 1072-1073
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Specimen Preparation for Materials Sciences
Abstract
Sample Preparation of Epitaxial InN Layers for Transmission Electron Microscopy
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- 26 July 2009, pp. 1074-1075
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Automated Sample Preparation of Nanoscale Devices for FESEM
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- 26 July 2009, pp. 1076-1077
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Instrumentation and Techniques
Transmission Electron Microscopy & Scanning Transmission Electron Microscopy
Abstract
Energy-filtered Diffracted Beam Interferometry/Holography (DBI/H)
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- 26 July 2009, pp. 1078-1079
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Performance of Low-voltage Electron Microscope with New Aberration Correction System and Cold Field Emission Gun
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- 26 July 2009, pp. 1080-1081
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Annular Dark Field Imaging of Catalyst Nanoparticles in Single Shot Dynamic Transmission Electron Microscopy
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- 26 July 2009, pp. 1082-1083
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Highly Stable 300kV Cold Field Emission Gun for 50pm Resolution Electron Microscopy
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- 26 July 2009, pp. 1084-1085
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New developments in phase Contrast Transmission Electron Microscopy with Electrostatic Phase Plate
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- 26 July 2009, pp. 1086-1087
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Evaluation of Methods for Quantification of Transmission Electron Microscopy (TEM) Dispersions
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- 26 July 2009, pp. 1088-1089
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REW program for the HRTEM image simulation, the alignment and the focus variation image reconstruction
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- 26 July 2009, pp. 1090-1091
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Near/Sub-50 pm TEM Resolution Images of Atoms Simulated with the Second Derivative of the Exit-Plane Wavefunction
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- 26 July 2009, pp. 1092-1093
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Fourier Analysis of Ronchigram and Aberration Assessment
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- 26 July 2009, pp. 1094-1095
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Observer Development for Automatic STEM Closed-Loop Control
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- 26 July 2009, pp. 1096-1097
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Characterization of the holography performance of a Titan 80-300 with high brightness Schottky electron gun and image Cs-corrector at 300kV acceleration voltage
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- 26 July 2009, pp. 1098-1099
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