Instrumentation and Techniques
Transmission Electron Microscopy & Scanning Transmission Electron Microscopy
Abstract
Using Holography to Evaluate CCD Camera Characteristics with High Accuracy
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- Published online by Cambridge University Press:
- 26 July 2009, pp. 1100-1101
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A Users Perspective of Remote TEM
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- Published online by Cambridge University Press:
- 26 July 2009, pp. 1102-1103
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EFTEM, EELS, and Cathodoluminescence in Si-implanted SiO2 Layers
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- 26 July 2009, pp. 1104-1105
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Scanning Electron Microscopy & X-Ray Analysis
Abstract
SEM Contrast of Semi-insulating Compound Materials
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- 26 July 2009, pp. 1106-1107
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Iterative Autofocus Algorithms for Scanning Electron Microscopy
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- Published online by Cambridge University Press:
- 26 July 2009, pp. 1108-1109
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Characterization of Porous Snow with SEM and Micro CT
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- 26 July 2009, pp. 1110-1111
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The Benefits Associated With a 1 mm Beam Gas Path Length on the Accuracy of X-ray Analysis in the Variable Pressure SEM
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- 26 July 2009, pp. 1112-1113
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Microscopy of High Chloride Primary Froth: Non-mixing of emulsified water
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- 26 July 2009, pp. 1114-1115
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Scanning Electron Microscopy and Analysis of Moist, Wet and Liquid Specimens
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- 26 July 2009, pp. 1116-1117
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Performance Check of a Wavelength Dispersive X-Ray Spectrometer (WDS) attached to the SEM
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- 26 July 2009, pp. 1118-1119
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A Test Material and a quick Procedure for the Performance Check of X-Ray Spectrometers attached to the SEM
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- 26 July 2009, pp. 1120-1121
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X-Ray Scattering and its Benefits for X-Ray Spectrometry at the SEM
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- 26 July 2009, pp. 1122-1123
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Comparison of Experimental and Calculated Spatial Resolution in X-ray Microanalysis of Oxide and Silicate Minerals
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- 26 July 2009, pp. 1124-1125
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The use of Au and Pt x-ray N lines for correct EDX analysis of C in gold and platinum depositions of micro and nano structures
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- 26 July 2009, pp. 1126-1127
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Cation Stoichiometry from Microanalysis of Complex Perovskite Oxides
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- 26 July 2009, pp. 1128-1129
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Surface Analysis techniques
Abstract
XPS Analysis of Fuel Cell Membrane Prepared Using an Ultra-Low-Angle-Microtomy Technique
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- 26 July 2009, pp. 1130-1131
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Scanned Probe Microscopy
Abstract
Scanning Surface Potential Microscopy of Spores on Planar Surfaces
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- 26 July 2009, pp. 1132-1133
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Size Dependent Dynamics of Cantilever Beams Immersed in Viscous Fluid
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- 26 July 2009, pp. 1134-1135
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Novel Operation Mode for Eliminating Influence of Inclination Angle and Friction in Atomic Force Microscopy
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- 26 July 2009, pp. 1136-1137
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Optical Fluorescence Microscopy
Abstract
Single-Molecule Electron Transfer Reaction in Nanomaterials
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- 26 July 2009, pp. 1138-1139
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