Microscopy and Microanalysis: Volume 18 -

High Resolution Microscopy Analysis of a New Precipitate Phase in Ni-rich NiTiHf and NiPdTiHf High Temperature Shape Memory Alloys
F. Yang, D. Coughlin, P. Phillips, L. Yang, M.J. Mills, R.D. Noebe
Published online by Cambridge University Press:

23 November 2012, pp. 366-367
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Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.

In-situ ABF-STEM Observation of Structure Transformation of Spinel LiV2O4 Crystals
S. Lee, Y. Tanishiro, K. Takayanagi, Y. Oshima
Published online by Cambridge University Press:

23 November 2012, pp. 368-369
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Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.

Investigation of Ordered-Vacancy Structures in Ga2(Se0.33Te0.67)3 Semiconductors via High-Resolution Electron Microscopy
N. Abdul-Jabbar, M. Boese, E. Bourret-Courchesne, B. Wirth
Published online by Cambridge University Press:

23 November 2012, pp. 370-371
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Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.

A study of crystal lattice fringe observation using the 30kV STEM
S. Takeshi
Published online by Cambridge University Press:

23 November 2012, pp. 372-373
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Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.

Reduce the electron damage in atomic resolved SEM observation using aberration corrected electron microscope.
M. Konno, T. Sato, H. Inada, K. Nakamura, Y. Zhu
Published online by Cambridge University Press:

23 November 2012, pp. 374-375
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Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.

A new statistical approach for generating meaningful particle size distributions from aberration corrected STEM-HAADF images of supported metal catalysts
Q. He, C.J. Kiely, S. Freakley, J.K. Edwards, G. Hutchings
Published online by Cambridge University Press:

23 November 2012, pp. 376-377
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Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.

Instabilities in scanning probe images of periodic structures: detection and corrections
N. Braidy, Y. Le Bouar, S. Lazar, C. Ricolleau
Published online by Cambridge University Press:

23 November 2012, pp. 378-379
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Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.

Measuring spin-state and ferromagnetic transitions in La1-xSrxCoO3 using in-situ atomic-resolution Z-contrast imaging and EELS in
A. Gulec, R.F. Klie
Published online by Cambridge University Press:

23 November 2012, pp. 380-381
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Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.

Co-Clustering Via Nanochannel-Membrane Modulated Ion Implantation into Si3N4 Observed By Plan-View Aberration-Corrected STEM And EELS
W. Guan, U. Bhatta, I.M. Ross, J. Ghatak, G. Moebus, N. Peng
Published online by Cambridge University Press:

23 November 2012, pp. 382-383
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Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.

Atomic Resolution Energy-Filtered HREM at High-Loss Region Using Cs- and Cc-Corrected TEM
J. Wen, D.J. Miller, N.J. Zaluzec, J.M. Hiller, R.E. Cook, A.B. Shah, J. Zuo
Published online by Cambridge University Press:

23 November 2012, pp. 384-385
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Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.

Determining the Atomic Structure of [111] Tilt Grain Boundaries in Ceria
W. Tong, H. Yang, J. Aguiar, N. Browning
Published online by Cambridge University Press:

23 November 2012, pp. 386-387
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Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.

Sample surface atomic resolution secondary electron imaging with an aberration corrected STEM
H. Inada, K. Nakamura, K. Tamura, Y. Suzuki, T. Sato, M. Konno, D. Su, J. Wall, Y. Zhu, J. Ciston
Published online by Cambridge University Press:

23 November 2012, pp. 388-389
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Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.

High Resolution Imaging and X-Ray Microanalysis with STEM in the FE-SEM
R. Gauvin, P. Michaud, N. Brodusch, M.L. Trudeau
Published online by Cambridge University Press:

23 November 2012, pp. 390-391
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Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.

Structural and Elemental Analysis of Heavily- Doped ZnO
A.V. Kvit, A.B. Yankovich, B.T. Puchala, D.D. Morgan, P.M. Voyles, V. Avrutin, H. Liu, N. Izyumskaya, U. Özgür, H. Morkoç
Published online by Cambridge University Press:

23 November 2012, pp. 392-393
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Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.

Aberration-Corrected STEM Study of Magnetic Alloys
S. Elhalawaty, A. Mardinly, R. Carpenter
Published online by Cambridge University Press:

23 November 2012, pp. 394-395
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Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.

Interface Structure and Interfacial Energy of Gold Nanocrystals on TiO2 Vicinal Surfaces
W. Gao, J. Zuo
Published online by Cambridge University Press:

23 November 2012, pp. 396-397
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Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.

Fast Atomic Level EELS Mapping Analysis using High-Energy Edges in DualEELS Mode
P. Longo, R.D. Twesten, P.J. Thomas
Published online by Cambridge University Press:

23 November 2012, pp. 398-399
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Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.

Scanning Confocal Electron Energy Loss Microscopy in TEAM 1.0 with Post-Specimen Cc Correction
H.L. Xin, H. Zheng, P. Ercius, C. Dwyer, D.A. Muller
Published online by Cambridge University Press:

23 November 2012, pp. 400-401
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Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.

Determining the Bulk and Surface Contributions in Electron Energy-loss Spectra from Aggregate Nanostructures
J. Zhu, P. Crozier, J. Anderson
Published online by Cambridge University Press:

23 November 2012, pp. 402-403
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Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.

Spectroscopy for Reducing Extreme Ultraviolet Lithography Mask Blank Defects
J. Harris-Jones
Published online by Cambridge University Press:

23 November 2012, pp. 404-405
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Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.

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Volume 18 - October 2012

Instrumentation Symposium

Applications of Aberration-Corrected STEM and SEM-08

Research Article

High Resolution Microscopy Analysis of a New Precipitate Phase in Ni-rich NiTiHf and NiPdTiHf High Temperature Shape Memory Alloys

In-situ ABF-STEM Observation of Structure Transformation of Spinel LiV2O4 Crystals

Investigation of Ordered-Vacancy Structures in Ga2(Se0.33Te0.67)3 Semiconductors via High-Resolution Electron Microscopy

A study of crystal lattice fringe observation using the 30kV STEM

Reduce the electron damage in atomic resolved SEM observation using aberration corrected electron microscope.

A new statistical approach for generating meaningful particle size distributions from aberration corrected STEM-HAADF images of supported metal catalysts

Instabilities in scanning probe images of periodic structures: detection and corrections

Measuring spin-state and ferromagnetic transitions in La1-xSrxCoO3 using in-situ atomic-resolution Z-contrast imaging and EELS in

Co-Clustering Via Nanochannel-Membrane Modulated Ion Implantation into Si3N4 Observed By Plan-View Aberration-Corrected STEM And EELS

Atomic Resolution Energy-Filtered HREM at High-Loss Region Using Cs- and Cc-Corrected TEM

Determining the Atomic Structure of [111] Tilt Grain Boundaries in Ceria

Sample surface atomic resolution secondary electron imaging with an aberration corrected STEM

High Resolution Imaging and X-Ray Microanalysis with STEM in the FE-SEM

Structural and Elemental Analysis of Heavily- Doped ZnO

Aberration-Corrected STEM Study of Magnetic Alloys

Applications of Aberration-Corrected STEM and SEM-09

Research Article

Interface Structure and Interfacial Energy of Gold Nanocrystals on TiO2 Vicinal Surfaces

Fast Atomic Level EELS Mapping Analysis using High-Energy Edges in DualEELS Mode

Scanning Confocal Electron Energy Loss Microscopy in TEAM 1.0 with Post-Specimen Cc Correction

Determining the Bulk and Surface Contributions in Electron Energy-loss Spectra from Aggregate Nanostructures

Spectroscopy for Reducing Extreme Ultraviolet Lithography Mask Blank Defects

Microscopy and Microanalysis

Refine listing

Actions for selected content:

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Volume 18 - October 2012

Instrumentation Symposium

Applications of Aberration-Corrected STEM and SEM-08

Research Article

Applications of Aberration-Corrected STEM and SEM-09

Research Article