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Fast Atomic Level EELS Mapping Analysis using High-Energy Edges in DualEELS Mode

Published online by Cambridge University Press:  23 November 2012

P. Longo ,
R.D. Twesten  and
P.J. Thomas
P. Longo
Affiliation:
Gatan Inc., Pleasanton, CA
R.D. Twesten
Affiliation:
Gatan Inc., Pleasanton, CA
P.J. Thomas
Affiliation:
Gatan Inc., Pleasanton, CA
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Abstract

Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.

Type
Research Article
Information
Microscopy and Microanalysis , Volume 18 , Issue S2: Proceedings of Microscopy & Microanalysis 2012 , July 2012 , pp. 398 - 399
Copyright
Copyright © Microscopy Society of America 2012

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