Microscopy and Microanalysis: Volume 21 -

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Microscopy and Microanalysis
ISSN: 1431-9276

EISSN: 1435-8115

URL: /core/journals/microscopy-and-microanalysis
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Microscopy and Microanalysis

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Volume 21 - August 2015

Technologist Forum, Tutorials and Outreach Symposia

X30 Technologists’ Forum: Emerging New Specialized Techniques for Correlative Microscopy

Abstract

Correlative Microscopy using Serial Blockface Scanning EM

X44 Bio Tutorial - Optimizing Specimen Preparation for Macromolecular Electron Microscopy

Abstract

Improving Our Vision of Nanobiology

Analytical and Instrumentation Science Symposia

A02 TEM Phase Contrast Imaging

Abstract

Electron Beam-Induced Charging and Modifications of Thin Films

Comparison of Cryo TEM Images Obtained with Zernike and Hole-Free Phase Plates

Practical Aspects and Usage Tips for the Volta Phase Plate

Combination of Different Techniques in Cryo-Electron Tomography with a Volta Phase Plate

A03 Electron Holography for Nanofields in Solids

Abstract

Electron Holography for Measuring Electrostatic Potentials and Strain Fields

Characterization of Trapped Charge in Ge/LixGe Core/Shell Structure during Lithiation using Off-axis Electron Holography

Aberration Corrected Off-Axis Electron Holography of Layered Transition Metal Dichalcogenides

In Situ Electron Holography of Ferroelectric Thin Films

A04 Advances in FIB: New Instrumentation and Applications in Materials and Biological Sciences

Abstract

The Perfect Cut: Focused Ion Beam Preparation for In Situ TEM

In-Situ EDS Characterization of TEM Lamellae Created by Xe Plasma FIB

Vacuum Assisted ex situ Lift Out of FIB Prepared Specimens

Focused Ne+ Ion Beams for Final Polishing of TEM Lamella Prepared Through Ga-FIB Systems

Examining Foil Sidewall Damage During TEM Sample Preparation Using Gallium FIB and Needle Geometries

A05 Fast and Ultrafast Imaging with Electrons and Photons

Abstract

Nanoscale Probes in Ultrafast Transmission Electron Microscopy

Infrared Pump-Probe Spectroscopy of Plasmons in Graphene and Semiconductors

Ultrafast Plasmonic Forces Imposed by Fast Electrons on Metal Particles

Photonic Processes Visualized with Electrons in Photoemission Electron Microscopy (PEEM)

A06 Advanced Analytical TEM/STEM

Abstract

Global Analysis Peak Fitting Applied to EELS Images

Microscopy and Microanalysis

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Volume 21 - August 2015

Technologist Forum, Tutorials and Outreach Symposia

X30 Technologists’ Forum: Emerging New Specialized Techniques for Correlative Microscopy

Abstract

X44 Bio Tutorial - Optimizing Specimen Preparation for Macromolecular Electron Microscopy

Abstract

Analytical and Instrumentation Science Symposia

A02 TEM Phase Contrast Imaging

Abstract

A03 Electron Holography for Nanofields in Solids

Abstract

A04 Advances in FIB: New Instrumentation and Applications in Materials and Biological Sciences

Abstract

A05 Fast and Ultrafast Imaging with Electrons and Photons

Abstract

A06 Advanced Analytical TEM/STEM

Abstract